Optical parameters of (Ga0.4In0.6)2Se3 thin films

Materials for Optical Sensors of X-ray Irradiation Based on (GaxIn1 – x)2Se3 Films

“…where 𝐸 U (𝑇 ) is the Urbach energy, 𝛼 0 and 𝐸 0 are the coordinates of the convergence point of the Urbach bundle, ℎ𝜈 and 𝑇 are the photon energy and temperature, respectively. It should be noted that, similarly to (Ga 𝑥 In 1−𝑥 ) 2 Se 3 crystals, the optical absorption edge in (Ga 𝑥 In 1−𝑥 ) 2 Se 3 films is also described by the Urbach relation [31][32][33]. It is worth to mention that the temperature variation of the Urbach absorption edge in the thin films under study sim-ilarly to that of the single crystals is explained by the electron-phonon interaction (EPI).…”

“…In recent years, the studies of the preparation of (Ga 𝑥 In 1−𝑥 ) 2 Se 3 mixed crystals in the form of films were performed for their effective practical application [11][12][13]. In Refs.…”

“…In Refs. [11][12][13], the refractive index and extinction coefficient dispersions were measured by spectral ellipsometry, as well as the temperature behavior of the Urbach absorption edge and the temperature dependences of the optical parameters were studied. Investigations of the influence of the different types of irradiation (in particular, X-ray irradiation) on physical parameters of thin films were determined by their application to the development of large-area, flexible, and light-weight radiation detectors [14].…”

Optical studies of X-ray irradiated (Ga0.4In0.6)2Se3 films

“…Recently a number of studies of thin films (GaxIn1-x)2Se3 have been performed, with the emphasis at their efficient applications [10,11]. In particular, the refractive index and extinction coefficient dispersions have been measured for the (Ga0.4In0.6)2Se3 film using spectral ellipsometry and the optical absorption edge has been examined in Ref.…”

“…In particular, the refractive index and extinction coefficient dispersions have been measured for the (Ga0.4In0.6)2Se3 film using spectral ellipsometry and the optical absorption edge has been examined in Ref. [11]. The works concerned with the influence of irradiations of different types (in particular, X-ray irradiation) on the physical parameters of thin films have been concentrated on their applications in large-area, flexible and light-weight radiation detectors [12].…”