Optical properties and electronic characteristics of liquid solutions of nickel in silicon

High-resolution laser flash photography for probing the solidification of the new double laser recrystallization process

“…The sequence of the resolidification process revealed by laser flash photography is shown in figure 4. Since the reflectivity of liquid silicon at the illumination wavelength (2 = 445 nm) is higher than that of a-Si, the liquid region appears bright [8]. On the other hand, because the poly-Si reflectivity is lower than that of a-Si, the resolidified poly-Si appears darker.…”

“…The data acquisition is achieved by a computer which is connected to the CCD camera. Since the reflectivity of a-Si (-50% at R.T.), liquid silicon (-70%) and poly-Si (-30% at R.T.) are different at the illumination wavelength (X = 445 nm), the melting and resolidification sequence can be identified [7][8].…”

Time-Resolved Laser-Induced Incandescence Measurements on Aerosolized Nickel Nanoparticles

“…However, it is commonplace in the LII literature , to model the spectral absorption efficiency with the Rayleigh approximation of the Mie theory, which is appropriate provided both | m λ | x p ≪ 1 and x p ≪ 1. − In this treatment, the spectral absorption coefficient is given by where E ( m λ ) is the spectral absorption function In this work, the refractive indices of Ni are taken to be those reported by Krishnan et al Figure presents these results and the corresponding E ( m λ ) values. Data from Miller and Shvarev et al is also plotted to indicate the variability of the optical properties reported in the literature. The refractive indices of solid Ni, which are used to model laser heating of the nanoparticles before they melt, were taken from Ordal et al…”

Measurement of solid–liquid interface temperature during pulsed excimer laser melting of polycrystalline silicon films

“…The optical refractive index of the p-Si film at the excimer laser wavelength was measured using a variable angle spectral ellipsometer, which is ñ exc ϭ1.2ϩ2.8i. Thermal and optical properties of bulk silicon 10,11 and quartz 10 were used in the calculation. The measurement matched well with the numerical simulation for quantities such as melt depth and melt duration.…”