Optical properties of nanocrystalline Si films derived by spectroscopic and multiangular ellipsometry

Yovchenko, Mykola; Buchenko, V.V.

doi:10.1109/caol.2016.7851369

2016 IEEE 7th International Conference on Advanced Optoelectronics and Lasers (CAOL) 2016

DOI: 10.1109/caol.2016.7851369

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Optical properties of nanocrystalline Si films derived by spectroscopic and multiangular ellipsometry

Mykola Yovchenko

V.V. Buchenko

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Optical properties of nanocrystalline Si films derived by spectroscopic and multiangular ellipsometry

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References 6 publications

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