Abstract. The TiO 2 thin films were prepared by vacuum evaporation on glass using TiO 2 powder 99.99% as coating material and with varying deposition speed. The TiO 2 thin films were characterized by a-step device, X-ray diffraction (XRD), atomic force microscope (AFM). The influence of deposition rate were discussed. The results indicated that thickness of the TiO 2 thin film was prepared under the deposition rate of 4Å/sec was 200 nm at room temperature, with amorphous structure. The film changed to anatase crystal structure when was annealed at 450 ℃ for one hour and the TiO 2 thin film was uniform and well combined with the glass substrate.
IntroductionTiO 2 has high chemical activity, good dispersion, high visible light transmittance and ultraviolet absorption properties such as excellent property. TiO 2 can be used as an important functional thin film materials. It is widely used in the field of solar cell, a photoelectric converter, sewage treatment, air purification, cleaning and sterilization etc.. There are three kinds of crystal types of typical TiO 2 : rutile, anatase and brookite. At present, there are a variety of methods for the preparation of TiO 2 films, such as sol-gel method[1-2],chemical vapor deposition [3], chemical spray pyrolysis [4] sputtering [5], pulsed laser deposition [6]. The structure, appearance and performance of different preparation techniques of thin films, such as the film thickness uniformity, and the glass substrate binding firmness, surface topography, has a different effect of crystal structure.In this paper, TiO 2 thin film was prepared by using vacuum evaporation method. The TiO 2 thin films were characterization by a-step device, X-ray diffraction (XRD), atomic force microscope (AFM) and UV-VIS spectrophotometer.