2019
DOI: 10.1364/ome.9.000663
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Optical properties of VO2 thin films deposited on different glass substrates

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Cited by 24 publications
(10 citation statements)
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“…However, in both samples the complex refractive index decreases with increasing wavelengths from 250 to 2500 nm. These results are consistent with optical constants such as n and k obtained from VO 2 thin films deposited on silica-soda-lime and silica-potash-soda using a UHV magnetron sputtering system, reported by Dai et al 30 . Similarly, Kana et al 31 fabricated VO 2 thin films onto various glass substrates by radiofrequency inverted cylindrical magnetron sputtering and then investigated temperature-dependent studies on optical constants.…”
Section: Resultssupporting
confidence: 92%
“…However, in both samples the complex refractive index decreases with increasing wavelengths from 250 to 2500 nm. These results are consistent with optical constants such as n and k obtained from VO 2 thin films deposited on silica-soda-lime and silica-potash-soda using a UHV magnetron sputtering system, reported by Dai et al 30 . Similarly, Kana et al 31 fabricated VO 2 thin films onto various glass substrates by radiofrequency inverted cylindrical magnetron sputtering and then investigated temperature-dependent studies on optical constants.…”
Section: Resultssupporting
confidence: 92%
“…Unlike electro-refractive effects which generate relatively small refractive index perturbations, optical phasetransition and phase-change materials boast gigantic refractive index contrast (with Δn usually well-exceeding unity) upon undergoing a solid-state phase transition. This unique behavior is identified in a handful of correlated oxides exemplified by vanadium dioxide (VO 2 ) [118][119][120] and chalcogenide compounds, such as Ge-Sb-Te (GST) or Ag-In-Sb-Te (AIST) alloys which switch between amorphous and crystalline phases [121][122][123][124]. The structural origins of the optical contrast in correlated oxides and chalcogenides are, however, fundamentally different.…”
Section: Optical Phase-change Mediamentioning
confidence: 99%
“…Эта программа выполняла расчет параметров пленочных слоев по измеренным величинам и . Расчет производился на базе стандартных эллипсометрических уравнений [14].…”
Section: образцы и методика экспериментаunclassified
“…Несмотря на это, данные по эллипсометрии легированных пленок диоксида ванадия в литературе представлены мало. А именно, имеется работа [14], в которой эллипсометрическим методом исследованы пленки VO 2 : Na и VO 2 : K. Но механизм изменения оптических констант вблизи T C -точки ФПИМ -остается неясным. Также имеется работа [15], где изучены показатель преломления n и коэффициент экстинкции k в очень широком диапазоне длин волн (300 nm−30 µm).…”
Section: Introductionunclassified