Optical reflectance and transmittance of a multilayer coating affected by refractive-index inhomogeneity, interface roughness, and thickness wedge

Nichelatti, E.; Montecchi, M.; Montereali, Rosa Maria

doi:10.1016/j.jnoncrysol.2008.11.040

Cited by 6 publications

(1 citation statement)

References 31 publications

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“…The latter is modelled by assuming the thickness to be Gaussian-like distributed with standard deviation σ , and variations along distances much greater than the wavelength λ . The program deals with moderately rough interfaces ( σ ≪ λ ) and limited radiation diffusion 11 .…”

Section: What Ksemaw Can Domentioning

confidence: 99%

KSEMAW: an open source software for the analysis of spectrophotometric, ellipsometric and photothermal deflection spectroscopy measurements

Montecchi¹,

Mittiga²,

Malerba³

et al. 2023

Open Res Europe

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The optical behavior of devices based on thin films is determined by complex refractive index and thickness of each slab composing the stack; these important parameters are usually evaluated from photometric and/or ellipsometric spectral measurements, given a model of the stack, by means of dedicated software. In the case of complex multilayer devices, generally a number of simpler specimens (like single-film on substrate) must be preliminarily characterized. This paper introduces the reader to a new open source software for thin film characterization finally released after about 30 years of development. The software has already been used in various fields of physics, such as thin film optical filters, architectural glazing, detectors for high energy physics, solar energy, and, last but not least, photovoltaic devices. Code source files, MS Windows executable, user manual as well as a sample of working directories populated with assorted files can be freely downloaded from the kSEMAW GitHub repository.

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Section: What Ksemaw Can Domentioning

confidence: 99%