Optical scattering measurements of random anti-reflective nanostructured surfaces in the mid- and long-wave IR

González, David; Meza-Galvan, Jesus; Sharp, David N.; Vijayraghavan, Karun; Poutous, Menelaos K.

doi:10.1117/12.2543788

Cited by 3 publications

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“…[1][2][3][4][5][6][7][8] Broadband response, high transmission across wide ranges of angle of incidence (AOI), and polarization insensitivity have also been reported. 9,10 In general, the AR effects correlate with the density and depth of the nanostructures, simulating an effective medium gradient-index boundary profile, which reduces Fresnel reflectivity.…”

Section: Introductionmentioning

confidence: 99%

Narrow-angle scatter of reflectivity-suppressing nanostructured surfaces

et al. 2020

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Antireflective nanostructured surfaces (ARSS) enhance optical transmission through suppression of Fresnel reflection at boundaries between layered media. Previous studies show that random ARSS (rARSS) exhibit broadband enhancement and polarization insensitivity in transmission when applied to flat optical windows. Zinc selenide windows with rARSS treatment were fully characterized (transmittance, reflectance, and angular scatter) in the midwave and long-wave infrared range (2 to 12 μm). Four morphologically different, random nanoroughness, antireflective surfaces were tested at: normal incidence transmission, at 15 deg angle of incidence, and 15 deg to 45 deg angle of reflection. The angular reflectance distribution resembles a diffuse dipole radiator due to the finite elongated beam cross section at the incidence surface. Scattering diagrams with main and side lobes are presented. Partially integrated scatter values were obtained, allowing the comparison of random antireflective boundary performance to optically flat surfaces. Comparing axial transmission and specular reflection with the scattered performance, an accurate determination of the redistribution of the incident energy is obtained. Measurements of the rARSS feature topology were determined from autocorrelation of the scanning electron microscope images of the nanoroughened substrates, to assess the structured surfaces' feature scales. The results show differences in scattered intensity over the wavelength bands of interest, correlating with surface random feature populations. © The Authors. Published by SPIE under a Creative Commons Attribution 4.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.

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