2017
DOI: 10.1002/pssa.201600749
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Optical signatures of silicon and oxygen related DX centers in AlN

Abstract: Bulk AlN crystals typically contain high concentrations of oxygen, silicon, and carbon À as also state-of-the art epitaxial layers typically do, depending on the specific growth conditions. In optical spectroscopy, such crystals show broad bands in the region from 2-5 eV in absorption and emission. We investigated several emission bands in the range from 1.4 to 1.9 eV, especially those centred at 2.0 and 2.4 eV, which under below-bandgap excitation with a 325 nm laser dominate the photoluminescence (PL) spectr… Show more

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Cited by 11 publications
(23 citation statements)
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“…At higher temperature, an ionization energy of 270 meV is found, which is attributed to the DX state of Si 33,34,[46][47][48] . Interestingly, S0 and S800 exhibit a higher activation energy of around 700 meV at high temperature, which is inferred from the ionization energy of residual oxygen in DX state in AlGaN 49 .…”
mentioning
confidence: 96%
“…At higher temperature, an ionization energy of 270 meV is found, which is attributed to the DX state of Si 33,34,[46][47][48] . Interestingly, S0 and S800 exhibit a higher activation energy of around 700 meV at high temperature, which is inferred from the ionization energy of residual oxygen in DX state in AlGaN 49 .…”
mentioning
confidence: 96%
“…For these SPEs, point defects in wide-bandgap semiconductors are one of the more promising quantum emitters that have been studied recently, due to their unique properties and potential applications. To date, defect-related SPEs have been reported in wide-bandgap semiconductors, such as in diamond, zinc oxide, silicon carbide (SiC), hexagonal boron nitride (hBN), and gallium nitride. Aluminum nitride (AlN) is also a wide-bandgap semiconductor with an optical transition energy of approximately 6.1 eV. AlN is a key semiconductor for next-generation photonic and electronic devices, especially in high-power electronics and high-temperature applications. , Recently, defect-related absorption and photoluminescence (PL) have been reported in AlN. For example, Lamprecht et al discussed a model for the deep defect-related emission bands between 1.4 and 2.4 eV . Schulz et al investigated defect-related PL in the near UV region between 3 and 4 eV .…”
mentioning
confidence: 99%
“…The highest value is attributed to V N vacancies 58 since the heavy surrounding Al atoms vibrate at very low frequency. In case of DX-states, the energy difference between the thermal activation depth and the absorption peak can be significantly higher; 37,38,[64][65][66] probably up to 1.8 eV. In the following sub-sections, we detail and summarize the data for each of the absorption bands in the B2 area of the AlN sample.…”
Section: Considerations On the Identification Of The Defect Levelsmentioning
confidence: 99%
“…These three impurities provide not only isolated substitutional defects (i.e., oxygen and carbon substituting nitrogen, and silicon substituting aluminum: O N, C N, Si Al ), [17][18][19][20][21][22] but are also assumed to form complexes, such as V Al -nSi Al , 23 V Al -nO N (n=1…4 is a number of Si or O atoms), 13,14,16,[23][24][25][26][27][28] C N -Si Al , 29 carbon pairs, 30 and tri-carbon complexes. 31 Usually, defects can have several allowed charge states in the bandgap, 32,33 including DXstates, [34][35][36][37][38] resulting in the polymorphism of defects properties. The current charge states of defects are given by the Fermi level which should be known first for a successful characterization of AlN crystals.…”
Section: Introductionmentioning
confidence: 99%