2020
DOI: 10.3788/aos202040.2131001
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Optical Spectra and Surface Morphologies of Near-Infrared Narrow Band-Pass Filters Using Dual Ion Beam Sputtering

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“…each with an optical thickness of 1/4 center wavelength of the transmission peak. [8][9][10] Here, we choose Ta 2 O 5 as the high refractive index film (H) material and SiO 2 as the low refractive index film (L) material. The simulation of the reflective layer with layer pairs is through the software "Essential Macleod" (Thin Film Center Inc) [11] , which is used for designing and calculating the film structure and reflectance parameters of optical thin films.…”
Section: Design and Fabrication Of Filtersmentioning
confidence: 99%
“…each with an optical thickness of 1/4 center wavelength of the transmission peak. [8][9][10] Here, we choose Ta 2 O 5 as the high refractive index film (H) material and SiO 2 as the low refractive index film (L) material. The simulation of the reflective layer with layer pairs is through the software "Essential Macleod" (Thin Film Center Inc) [11] , which is used for designing and calculating the film structure and reflectance parameters of optical thin films.…”
Section: Design and Fabrication Of Filtersmentioning
confidence: 99%