2021
DOI: 10.1109/jsen.2020.3013024
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Optical Stepped Thermography of Defects in Photovoltaic Panels

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Cited by 16 publications
(7 citation statements)
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“…Thus, it becomes feasible to concurrently identify multiple faults by evaluating variations in the impedance of PV modules i N = 1, …, at the fault locations. Equations (10) can be reformulated as (11), allowing for the derivation of impedance values R i i N ( ), = 1, …, c , using (12) and (13).…”
Section: Peaks and Valleys Matricesmentioning
confidence: 99%
See 1 more Smart Citation
“…Thus, it becomes feasible to concurrently identify multiple faults by evaluating variations in the impedance of PV modules i N = 1, …, at the fault locations. Equations (10) can be reformulated as (11), allowing for the derivation of impedance values R i i N ( ), = 1, …, c , using (12) and (13).…”
Section: Peaks and Valleys Matricesmentioning
confidence: 99%
“…[2][3][4][5][6][7] Despite their proven effectiveness, these methods face limitations, including the requirement for costly equipment, the labor-intensive nature of inspections, and the challenge of managing large data sets in learning-based approaches. [8][9][10] Thermal imaging and I-V curve analysis play pivotal roles in fault detection, [11][12][13] albeit with limitations in the precision of fault localization. Other techniques 14 suggest the use of thermal images and convolutional neural networks (CNNs) for fault diagnosis in solar panels, which represents a novel and effective method for enhancing maintenance and efficiency.…”
Section: Introductionmentioning
confidence: 99%
“…A transfer learning approach is presented in [11,12] towards the detection of a defect in the solar surface panel, which combines the result of transfer learning with AlexNet CNN. Applying a data processing scheme to thermal images [13,14] for background subtraction, and applying discrete Fourier transform and histogram equalization scheme to enhance the quality of the image. Towards localizing the defect in PV panels and cells, ST has been used in [15].…”
Section: Related Workmentioning
confidence: 99%
“…Tsuzuki et al [3] proposed using the relationship between voltage and current obtained on specific semiconductors to detect their defects. Cai et al [4] proposed a stepwise thermal imaging method for detecting defects in photovoltaic panels. Although the aforementioned methods can identify specific types of defects in solar panels, they are plagued by problems such as low detection accuracy and inefficiency.…”
Section: Introductionmentioning
confidence: 99%