ÂËÏÇÐßÛËÇ ËÊÄÇÔÕÐÞÇ ÓÂÊÏÇÓÞ ×ÑÍÂÎßÐÑÅÑ ÒâÕÐÂ, As a result of intensive development work ì carried out in large part by Russian scientists ì X-ray refractive optics has now become one of the most rapidly progressing éelds in modern physical optics. This review examines the features and properties of refractive devices and discusses the concept of a planar lens of silicon or other materials. Refractive lens applications such as X-ray image conversion, photon crystal research and the focusing of high energy X-ray telescopes are discussed.
ÂËÏÇÐßÛËÇ ËÊÄÇÔÕÐÞÇ ÓÂÊÏÇÓÞ ×ÑÍÂÎßÐÑÅÑ ÒâÕÐÂ, As a result of intensive development work ì carried out in large part by Russian scientists ì X-ray refractive optics has now become one of the most rapidly progressing éelds in modern physical optics. This review examines the features and properties of refractive devices and discusses the concept of a planar lens of silicon or other materials. Refractive lens applications such as X-ray image conversion, photon crystal research and the focusing of high energy X-ray telescopes are discussed.
“…As is known 9) , there exists analytical theory for the focal spot structure at the focal plane for one zone plate. Both cases of circular zones (for 2D-focusing) and linear zones (for 1D-focusing) allows analytical description.…”
Section: The Theory and Computer Simulationsmentioning
We presents the results of study of focusing and imaging properties of double-lens system for hard x-ray radiation consisting of two Fresnel zone plates (ZP) made from silicon.We demonstrate for the first time the phenomenon of focusing by two crystal ZP located at significant distance from each other. We investigate by both theoretically and experimentally the peculiarities of intensity distribution at the focal plane during a scan by second ZP normally to the optical axis of the system. We investigate as well the intensity distribution along the optical axis for our double-lens system from crystal ZP.We realize experimentally a registration of the focused image of the object by means of double-lens system based on ZP. Measurements are performed on the beam line BM-5 of the European Synchrotron Radiation Facility (ESRF) at the x-ray energy 9.4 keV. We elaborate a computer program for theoretical simulation of the optical properties of x-ray double-lens system based on ZPs. A calculation is made by convolution of transmission function and Kirchhoff propagator in paraxial approximation by means of Fast Fourier Transformation.
“…Zone plates are obtained from Gate Micro Technology, Rome, Italy, with expected diffraction-limited resolution of about 80 nm. Zone plates are diffractive optics (Michette, 1986) which require an order-selecting aperture (OSA) to select the desired order for focusing (usually the ®rst-order diffraction is used).…”
Section: Zone-plate Focusing Beam Collimation and Beam-position Monimentioning
The Synchrotron Radiation Research Center (SRRC) and the Institute of Atomic and Molecular Sciences (IAMS) have initiated a project to construct a scanning photoelectron spectromicroscopy end station at SRRC (SRRC-SPEM). High-brightness soft X-rays will be provided by the U5 undulator beamline. Zone-plate-based soft X-ray optics will be used to focus the beam to form the microprobe. A hemispherical sector analyser with multichannel detection capability will collect the photoelectrons. A total of up to 32 images can be acquired concurrently. The apparatus is also equipped with a sample distribution system for in situ sample preparation and characterization in conjunction with other surface spectroscopic techniques.
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