Optically induced current deep level spectroscopy of radiation defects in neutron irradiated Si pad detectors

Gaubas, E.; Bajarūnas, Darius; Čeponis, T.; Meškauskaite, D.; Pavlov, J.

doi:10.3952/lithjphys.53407

Lith. J. Phys.

2013

DOI: 10.3952/lithjphys.53407

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Optically induced current deep level spectroscopy of radiation defects in neutron irradiated Si pad detectors

E. Gaubas¹,

Darius Bajarūnas²,

T. Čeponis³

et al.

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Optically induced current deep level spectroscopy of radiation defects in neutron irradiated Si pad detectors

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References 14 publications

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