Optics and optoelectronics: FEM and BEM analyses A bibliography (1998–1999)

Mackerle, Jaroslav

doi:10.1016/s0168-874x(00)00058-5

Cited by 4 publications

(3 citation statements)

References 186 publications

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“…Silvester presented the first application of FEM for solving the electromagnetic field problem based on Maxwell's equation. Recently, there has been significant progress toward FEM applications in optics, optical engineering, and nanotechnology. , Here, we use FEM with a frequency-domain approach and a fully enclosing three-dimensional mesh, based on the tetrahedral (first order) elements to simulate the near-field problem of tip and nanoparticle-induced local electric-field enhancement in an AFM-SERS experiment. Four different geometric configurations (Figure a−d) are modeled, corresponding to realistic AFM-SERS scenarios.…”

Section: Models and Methodsmentioning

confidence: 99%

Finite Element Method Simulation of the Field Distribution for AFM Tip-Enhanced Surface-Enhanced Raman Scanning Microscopy

et al. 2003

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Electric field enhancement distributions encountered in atomic force microscopy (AFM) tip-enhanced surfaceenhanced Raman spectroscopy (SERS) experiments (AFM-SERS) are simulated using a frequency-domain three-dimensional finite element method to solve Maxwell's equations of electric field distributions. We simulated an electromagnetic field enhancement in the vicinity of an AFM tip in close proximity to silver spherical nanoparticles under the illumination of a laser beam of various incident angles under different geometric arrangements. Maximum electric field enhancement is discussed in terms of the relative position of the tip and nanoparticles, as well as the direction of excitation laser propagation. Our results suggest new approaches for using AFM-SERS tip-enhanced near-field technique to image samples on surfaces.

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Section: Models and Methodsmentioning

confidence: 99%

Finite Element Method Simulation of the Field Distribution for AFM Tip-Enhanced Surface-Enhanced Raman Scanning Microscopy

et al. 2003

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“…With a gradual increase of computing power in the last three decades, there has been a significant increase in the number of finite element methods applications in microwave engineering, optics, and optical engineering, and recently in nanotechnology. ,, In this work, we used FEM with a frequency domain approach and a fully enclosing three-dimensional mesh based on tetrahedral (first-order) elements to simulate the near-field enhancement of the fractal surfaces. Figure shows the 2D representations of three-generation motifs of the regular fractal surfaces that we used to depict different repetitive rough interfaces.…”

Section: Models and Methodsmentioning

confidence: 99%

Finite Element Method Simulations of the Near-Field Enhancement at the Vicinity of Fractal Rough Metallic Surfaces

Mićić

Klymyshyn

2004

J. Phys. Chem. B

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We report on (1) simulations of the influence of different surface morphologies on electromagnetic field enhancements at the rough surfaces of noble metals, and (2) the evaluations of the optimal conditions for the generation of a surface-enhanced Raman signal of absorbed species on a metallic substrate. All simulations were performed with a classical electrodynamics approach using the full set of Maxwell's equations that were solved with the three-dimensional finite element method (FEM). Two different classes of surfaces were modeled using fractals, representing dendritic and sponge-like structures. The simulations depict the high inhomogeneity of an enhanced electromagnetic field as that both a field enhancement and a field attenuation near the surface existed. While the dendritical fractals enhanced the local electromagnetic field, the sponge-like fractals significantly reduced the local electromagnetic field intensity. Moreover, the fractal orders of the fractal objects did not significantly alter the total enhancement, and the distribution of a near-field enhancement was essentially invariant to the changes in the angle of an incoming laser beam.

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“…FEM is a well-established and reliable computational approach in electrical engineering research for simulating electromagnetic fields. Recently, there has been significant progress towards FEM applications in optics, optical engineering, and nanotechnology [10,25,40,41]. Other computational simulation methods include the FDTD method [29,30,42], multiple multipole method (MMP) [27] and the time-domain finiteelement method [28].…”

Section: Finite Element Methods Analysismentioning

confidence: 99%

Correlated topographic and spectroscopic imaging by combined atomic force microscopy and optical microscopy

Hu¹,

Mićić²,

Klymyshyn³

et al. 2004

Journal of Luminescence

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Optics and optoelectronics: FEM and BEM analyses A bibliography (1998–1999)

Cited by 4 publications

References 186 publications

Finite Element Method Simulation of the Field Distribution for AFM Tip-Enhanced Surface-Enhanced Raman Scanning Microscopy

Finite Element Method Simulation of the Field Distribution for AFM Tip-Enhanced Surface-Enhanced Raman Scanning Microscopy

Finite Element Method Simulations of the Near-Field Enhancement at the Vicinity of Fractal Rough Metallic Surfaces

Correlated topographic and spectroscopic imaging by combined atomic force microscopy and optical microscopy

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