2003
DOI: 10.1002/qre.516
|View full text |Cite
|
Sign up to set email alerts
|

Optimal control limits for CCC charts in the presence of inspection errors

Abstract: The control chart based on cumulative count of conforming (CCC) items between the occurrence of two non-conforming ones, or the CCC chart, has been shown to be very useful for monitoring high-quality processes. However, as in the implementation of other Shewhart-type control charts, it is usually assumed that the inspection is free of error. This assumption may not be valid and this may have a significant impact on the interpretation of the control chart and the setting of control limits. This paper first inve… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

1
19
0

Year Published

2007
2007
2016
2016

Publication Types

Select...
10

Relationship

1
9

Authors

Journals

citations
Cited by 25 publications
(20 citation statements)
references
References 14 publications
1
19
0
Order By: Relevance
“…, X n } in order statistics when X i 's follow, respectively, the Bernoulli and standard power distributions (Balakrishnan and Nevzorov 2003). Similarly, E(R) * = 1 1−(1−p) n , E(R) * = nβ nβ−1 , and E(R) * = √ πα 2 √ n in Theorems 3, 4, and 5, Pin et al (2002) Nuclear power plant maintenance Tidström (2004) Analysis of voting behavior Degan (2004) (Standard) Power Supply chain coordination Cachon (2002) Financial engineering van Dorp and Kotz (2002) Labor economics Barlevy (2003) Geometric Healthcare industry Carnahan et al (2006) Housing market Huang and Palmquist (2001) Quality control charts Ranjan et al (2003) (Standard) Pareto Automobile insurance Cohen (2003) Marketing Research Miller and Liu (2006) Satellite communications Jiang and Leung (2003) Rayleigh Budget forecasting Lee et al (1997) Image Processing Kuruoglu and Zerubia (2004) Solar energy engineering Moriarty et al (2002) respectively, if the probability distributions of the same family share a common parameter. These, too, coincide with the respective expected values of X (1) = Min{X 1 , X 2 , .…”
Section: Discussionmentioning
confidence: 99%
“…, X n } in order statistics when X i 's follow, respectively, the Bernoulli and standard power distributions (Balakrishnan and Nevzorov 2003). Similarly, E(R) * = 1 1−(1−p) n , E(R) * = nβ nβ−1 , and E(R) * = √ πα 2 √ n in Theorems 3, 4, and 5, Pin et al (2002) Nuclear power plant maintenance Tidström (2004) Analysis of voting behavior Degan (2004) (Standard) Power Supply chain coordination Cachon (2002) Financial engineering van Dorp and Kotz (2002) Labor economics Barlevy (2003) Geometric Healthcare industry Carnahan et al (2006) Housing market Huang and Palmquist (2001) Quality control charts Ranjan et al (2003) (Standard) Pareto Automobile insurance Cohen (2003) Marketing Research Miller and Liu (2006) Satellite communications Jiang and Leung (2003) Rayleigh Budget forecasting Lee et al (1997) Image Processing Kuruoglu and Zerubia (2004) Solar energy engineering Moriarty et al (2002) respectively, if the probability distributions of the same family share a common parameter. These, too, coincide with the respective expected values of X (1) = Min{X 1 , X 2 , .…”
Section: Discussionmentioning
confidence: 99%
“…An inspection error may occur when either a system failure is classified as a non-failure or a nonfailure is classified as a system failure. Ranjan et al 26 show that even if inspection errors are present, the average time to signal an alarm, in terms of the ARL of a geometric chart increases in the beginning when the process deteriorates. They discuss an approach to set the control limits in order to maximize the ARL when the process is at the nominal level and inspection errors are present.…”
Section: Case 1: a Decrease Inmentioning
confidence: 98%
“…For variable TBE charts, researchers developed exponential CUSUM chart (Lucas, 1985;Vardeman & Ray, 1985), exponential EWMA chart (Gan, 1998) and exponential chart (Xie, Goh, & Ranjan, 2002;Zhang, Xie, & Goh, 2006). And for attribute TBE charts, cumulative count of conforming (CCC) chart has been widely studied (Kuralmani, Xie, Goh, & Gan, 2002;Ranjan, Xie, & Goh, 2003;Xie, Goh, & Kuralmani, 2000). In fact, some researchers utilize the name of conforming run length (CRL) instead of the name of CCC, but they have the same statistical meaning.…”
Section: Introductionmentioning
confidence: 98%