1994 IEEE MTT-S International Microwave Symposium Digest (Cat. No.94CH3389-4) 1994
DOI: 10.1109/mwsym.1994.335141
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Optimal noise matching of 0.25 micron gate GaAs MESFETs for low power personal communications receiver circuit designs

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Cited by 4 publications
(3 citation statements)
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“…DC and S-parameter of many GaAs and InP transistors were measured on wafer both at room temperature and cryogenic temperature. From these measurements we could extract the noise models [6][7][8][9][10][11][12][13][14] which were later used at cryogenic temperatures for the amplifier design. At low temperature the transconductance of both InP and GaAs transistors increase, Figs.…”
Section: Device Modelingmentioning
confidence: 99%
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“…DC and S-parameter of many GaAs and InP transistors were measured on wafer both at room temperature and cryogenic temperature. From these measurements we could extract the noise models [6][7][8][9][10][11][12][13][14] which were later used at cryogenic temperatures for the amplifier design. At low temperature the transconductance of both InP and GaAs transistors increase, Figs.…”
Section: Device Modelingmentioning
confidence: 99%
“…Thus, in order to improve the accuracy of the noise measurements and validate the noise models both at room and cryogenic temperatures a special pre-matched circuit was designed. This pre-matched circuit includes the input matching network calculated from the extracted model, transistor bonded in the fixture and the necessary bias networks in order to stabilize the transistor at cryogenic Another issue is selecting the right device size so to obtain optimum input capacitance Cgs, high ft and low Rn and thus to make the matching networks rather simple in order to achieve broadband operation [12,13], because the noise performance depends linearly on ft(gm) and (Td and Tg)^0.5. These relations are general for all FETs.…”
Section: Device Modelingmentioning
confidence: 99%
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