Optimal on-line built-in self-test structure for system-reliability improvement

An Optical BILBO for Online Testing of Embedded Systems

“…It would require no redesign of the circuit under test (CUT) and impose no functional or structural restrictions on it [2]. Most BIST methods meet some of these constraints without addressing others [21]. Considering all four parameters in the design of an online testing scheme may create conflicting goals.…”

Remote online testing of embedded systems using Optical BILBO

“…So, a large variety of on-line testing techniques has been proposed in the literature [3,4]. Such techniques are for instance: self-checking design, signature monitoring, on-line monitoring of reliability relevant parameters such as current or temperature, implementation of BIST techniques specific to on line testing, etc.…”

A Binary Decision Diagram based on-line testing of digital VLSI circuits for feedback bridging faults

“…As in the deep sub-micron era such faults are becoming dominant, OLT has become a crucial component of DFT. Since the last two decades, OLT for digital circuits has been studied and can be broadly classified into the following main categories: (i) signature monitoring in finite state machines (FSMs) [26,34], (ii) self-checking design [31,33,[14][15][16]12,36,11,17], (iii) partial replication [37,19,4], and (iv) on-line built-in-self-test (BIST) [3,[38][39][40]21,35,32]. The major performance metrics for OLT used in these schemes were non-intrusiveness (i.e., minimal change to the original circuit), totally self-checking, low area overhead, high fault coverage (stuck-at fault), low detection latency, etc.…”