2022 IEEE Silicon Nanoelectronics Workshop (SNW) 2022
DOI: 10.1109/snw56633.2022.9889070
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Optimal Read Voltages of Retention-after-Cycling in Triple-level-cell (TLC) 3D NAND Flash Memory and its High-precision Modeling Method

Hongzhe Lin
1
,
Yifan Guo
2
,
Yifang Xi
3
et al.
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