2012
DOI: 10.1016/j.vacuum.2012.06.011
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Optimising deposition parameters of W-DLC coatings for tool materials of high speed steel and cemented carbide

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Cited by 50 publications
(22 citation statements)
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“…Therefore, the obvious slight scatter in the correlation diagram (Figure 7) is definitely not primarily caused by random influences. Additionally, the results of the present study indicate that this effect of φ(C 2 H 2 ), which was also reported by Czyżniewski [39], is more pronounced at low sputtering power (two-factor interaction AD). An increase in the ethine flow rate results in an increased and, hence, more favorable H/E ratio.…”
Section: H/e Ratiosupporting
confidence: 90%
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“…Therefore, the obvious slight scatter in the correlation diagram (Figure 7) is definitely not primarily caused by random influences. Additionally, the results of the present study indicate that this effect of φ(C 2 H 2 ), which was also reported by Czyżniewski [39], is more pronounced at low sputtering power (two-factor interaction AD). An increase in the ethine flow rate results in an increased and, hence, more favorable H/E ratio.…”
Section: H/e Ratiosupporting
confidence: 90%
“…Within the scope of smaller studies, an increase in hardness with increasing bias voltage is also described in [5,12,39]. A general decrease in hardness with increasing ethine flow rate is shown in [12,39]. Furthermore, [12] describes a relationship between the deposition parameters, ethine flow and bias voltage, and the mechanical properties, reduced Young's modulus and hardness, which is similar to that observed in the present study.…”
Section: Young's Modulus and Indentation Hardnesssupporting
confidence: 83%
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“…Hard Cr/CrN x -layers are used as adhesion promoter between substrate and the upper layers. A tungsten doped a-C:H interlayer (a-C:H:W) is used as an mediator between the adhesion and the top layer to further improve the fracture toughness [11,12]. Both variants were tribologically analyzed, wherein the influence on mechanical properties of the deposition parameters was investigated for the Cr/CrN x /a-C:H:W layer system.…”
Section: Introductionmentioning
confidence: 99%