2015
DOI: 10.1002/aelm.201500195
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Optimization of Electronic Domain‐Wall Properties by Aliovalent Cation Substitution

Abstract: Electronic domain‐wall conductance is controlled by chemical aliovalent doping in the p‐type semiconductor Er1‐xCaxMnO3. Coexisting bound (top panel) and mobile (lower panel) charges at the walls are analyzed using electrostatic force micro­scopy. Emergent doping‐related variations are quantified by local transport measurements and explained based on phenomenological theories.

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Cited by 37 publications
(67 citation statements)
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“…Possible origins were discussed in the main text (see also Ref. 16). As mentioned there, then the sample can be described by a parallel RC circuit for the layers (with Rl and Cl for the layer resistance and capacitance, respectively), connected in series to the bulk sample [ Fig.…”
Section: Non-intrinsic Relaxor Behaviormentioning
confidence: 99%
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“…Possible origins were discussed in the main text (see also Ref. 16). As mentioned there, then the sample can be described by a parallel RC circuit for the layers (with Rl and Cl for the layer resistance and capacitance, respectively), connected in series to the bulk sample [ Fig.…”
Section: Non-intrinsic Relaxor Behaviormentioning
confidence: 99%
“…These considerations are based on Refs. [16] and [26] of the main paper. As mentioned in the main text, Maxwell-Wagner (MW) relaxations can be caused by the existence of thin insulating layers within the sample or at its surface, termed internal barrier layer capacitors (IBLCs) or surface barrier layer capacitors (SBLCs), respectively.…”
Section: Non-intrinsic Relaxor Behaviormentioning
confidence: 99%
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