2023 IEEE International Reliability Physics Symposium (IRPS) 2023
DOI: 10.1109/irps48203.2023.10118266
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Optimization of SCR for High-Speed Digital and RF Applications in 45-nm SOI CMOS Technology

Srivatsan Parthasarathy
1
,
Yuanzhong Zhou
2
,
Jean-Jacques Hajjar
3
et al.
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