2021
DOI: 10.1016/j.optlastec.2021.107246
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Optimization of surface roughness and dimensional accuracy in LPBF additive manufacturing

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Cited by 114 publications
(36 citation statements)
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“…The dot-line curves of PV and EV are related to the left ordinate, while the bars of RE are related to the right ordinate. Although the overall RE of R is larger than that of TEC and DWR, it is acceptable compared with the maximal relative error of the predictive model on surface roughness in the related literature [45] . In general, EM fits the three responses well and can be effective in the prediction of the fiber LST process.…”
Section: Validation Of Emmentioning
confidence: 86%
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“…The dot-line curves of PV and EV are related to the left ordinate, while the bars of RE are related to the right ordinate. Although the overall RE of R is larger than that of TEC and DWR, it is acceptable compared with the maximal relative error of the predictive model on surface roughness in the related literature [45] . In general, EM fits the three responses well and can be effective in the prediction of the fiber LST process.…”
Section: Validation Of Emmentioning
confidence: 86%
“…The R value of each experiment was measured by a confocal microscope. The one-dimensional formula of surface roughness for a surface with a profile length L can be expressed as where f(x) is the variation of local surface height at the point x compared with the average height of the whole profile with the assumption that the whole profile is even [45] . f m is the height of m positions along the profile length L, and the surface roughness can be formulated as…”
Section: Processing Qualitymentioning
confidence: 99%
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“…Using a data-driven framework to handle the data transfer during the lifecycle of the metallic part would enable the smart transformation of metal AM processes [166]. Data-driven models to test manufacturability and test design for AM rules have been suggested by Ko et al [167], while data-driven models to predict surface roughness of printed parts were suggested by Cao et al [168]. Majeed et al [166] proposed a data-driven framework to handle real-time and non-real-time data for the product lifecycle of AM.…”
Section: Am Framework Developmentmentioning
confidence: 99%
“…There are numerous AM process variables, e.g., beam parameters [ 1 , 2 , 3 ], scanning parameters (pattern, speed, power) [ 4 , 5 , 6 , 7 , 8 , 9 , 10 ], powder characteristics and distribution [ 11 , 12 , 13 ], which can induce internal defects and largely affect the surface roughness. For example, Yang et al.…”
Section: Introductionmentioning
confidence: 99%