Optimization of the two-stage common-emitter transistor amplifier for equalization circuit in visible light communication system

Huang, Hua‐Dong; Wang, Chao; Wu, Huayue; Huang, Cheng; Yang, Zhuobo; Wang, Hong

doi:10.1007/s11082-018-1613-y

Cited by 11 publications

(2 citation statements)

References 14 publications

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“…The radio-frequency (RF) transistor BFP650, based on Silicon-Germanium: Carbon (SiGe:C) technology, is chosen for the amplifier circuit of the FE board considering its advantages (low cost, low power consumption, low noise and high speed, among others) [7,8]. A1 and A2 are both typical common-emitter RC coupled amplifier, as shown in figure 4, where 𝑅 𝐿 is the load resistance of the circuit [9,10]. Compared to the common-base and common-collector amplifiers, the common-emitter amplifier can achieve a larger voltage gain.…”

Section: Amplifiermentioning

confidence: 99%

Development of a front-end electronics for thin-gap resistive plate chamber

Ge¹,

Li²,

Su³

et al. 2021

J. Inst.

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To cope with the challenge of high hit rates in some applications, the new-generation large-area Resistive Plate Chamber (RPC) with 1 mm thin gap was proposed. Compared to the RPC generation presently, the signal of the thin-gap RPC is much weaker (of the order of hundreds of μV) and faster (pulse width of about 5 ns). Hence a new-generation Front-End (FE) electronics needs to be developed for the thin-gap RPC. The FE board contains 8 independent electronic channels, each with an amplifier, a discriminator, and a Low-Voltage Differential Signaling (LVDS) transmitter. The amplifier is made of discrete components, with particular emphasis on SiGe:C transistors. A simplified but stable power system is designed for the FE board, and its status can be monitored in real-time. The test results show that the overall charge gain of the FE amplifier reaches 0.4 mV/fC, with very low noise (lower than 700 μV RMS with up to 10 pF input detector capacitance), and good linearity when the amplitude of the input amplitude is lower than 3 mV. The -3-dB bandwidth of the amplifier reaches 154 MHz. The jitter caused by the electronics (including amplifier, discriminator and LVDS transmitter) is around 10 ps when the threshold voltage is higher than 20 mV. The maximum event rate per channel exceeds 20 MHz. The cosmic ray test was conducted with two FE boards mounted on a 1 mm thin-gap RPC of 1.4 × 0.4 m2 area. The efficiency of the detector system reaches 95% when the threshold voltage is 20 mV, with almost no accidental coincidence event. The overall time resolution of the detector system is 484 ps. The performance of our FE electronics satisfies the requirement of the thin-gap RPC.

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Section: Amplifiermentioning

confidence: 99%

Development of a front-end electronics for thin-gap resistive plate chamber

Ge¹,

Li²,

Su³

et al. 2021

J. Inst.

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“…It is a highly integrated, complete characterization for radio frequency and microwave impedance measurement solution. The embedded software installed in the E5080B enables complete device characterization for passive device and components for researcher [14]. This VNA package with an extra wide bandwidth of up to 152 dB dynamic range feature improves the RF component and system testing throughput.…”

Section: Selection Of Network Analyzermentioning

confidence: 99%

Evaluation of Type A Uncertainty in a Network Analyzer From 300 kHz to 8.5 GHz

Hui¹,

Hashim²,

Salleh³

2020

Adv. sci. technol. eng. syst. j.

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Network Analyzer is equipment widely used for the execution of radio frequency application scattering parameters. Throughout absolute reading the scattering parameter measured. An absolute reading does not include error, drift, offset, linearity, resolution, coefficient of sensitivity and several other variables that will contribute to the measured measurement dispersion. Type A evaluations of measurement uncertainty clarified according to ISO / IEC Guide 98-1. Type A uncertainty assumption is always done best to characterize an input quantity given in repeated indication values. The assumption was calculated from arithmetic mean, variance of probability distribution and standard deviation respected to the frequency from 300 kHz to 8.5 GHz in a Network Analyzer measurements. Furthermore, ISO/IEC 17025 is the standard for accredited testing and calibration laboratory to calculate the uncertainty of measurement to be declared in the scope of accreditation. Type A uncertainty calculation is one of the mandatory requirements for an accredited testing and calibration laboratory. The Type A uncertainty will be combined with Type B uncertainty to calculate the expanded uncertainty in measurement.

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Compromise between illumination performance and modulation bandwidth for micro-size white light-emitting diode by selecting injected current

Huang

et al. 2019

Appl. Phys. A

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Optimization of the two-stage common-emitter transistor amplifier for equalization circuit in visible light communication system

Cited by 11 publications

References 14 publications

Development of a front-end electronics for thin-gap resistive plate chamber

Development of a front-end electronics for thin-gap resistive plate chamber

Evaluation of Type A Uncertainty in a Network Analyzer From 300 kHz to 8.5 GHz

Compromise between illumination performance and modulation bandwidth for micro-size white light-emitting diode by selecting injected current

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