Optimization of Tunnel Field-Effect Transistor-Based ESD Protection Network

Abstract

The tunnel field-effect transistor (TFET) is a potential candidate for replacing the reverse diode and providing a secondary path in a whole-chip electrostatic discharge (ESD) protection network. In this paper, the ESD characteristics of a traditional point TFET, a line TFET and a Ge-source TFET are investigated using technology computer-aided design (TCAD) simulations, and an improved TFET-based whole-chip ESD protection scheme is proposed. It is found that the Ge-source TFET has a lower trigger voltage and higher failure current compared to the traditional point and line TFETs. However, the Ge-source TFET-based secondary path in the whole-chip ESD protection network is more vulnerable compared to the primary path due to the low thermal instability. Simulation results show that choosing the proper germanium mole fraction in the source region can balance the discharge ability and thermal failure risk, consequently enhancing the whole-chip ESD robustness.