Optimized analysis of deuterium depth profiles in beryllium

Oberkofler, M.; Piechoczek, R.; Linsmeier, Ch.

doi:10.1088/0031-8949/2011/t145/014011

Cited by 3 publications

(3 citation statements)

References 17 publications

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“…In a previous work we have investigated the depth resolution of different ion beam analysis methods for detecting near-surface deuterium [1]. In greater depths the resolution deteriorates due to geometrical and electronic straggling.…”

Section: Introductionmentioning

confidence: 99%

“…The two most common reactions for detecting the hydrogen isotopes deuterium and protium are shown in equations (1) and (2).…”

Section: Introductionmentioning

confidence: 99%

“…Compared to reaction (1), reaction (2) has a very narrow resonance at 6385 keV with a width of 1.8 keV. The off-resonance cross section drops by four orders of magnitude [6].…”

Section: Introductionmentioning

confidence: 99%

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Experimental resolution of deuterium and hydrogen depth profiling with the nuclear reactions D(3He,p)α and p(15N,α,γ)12C

Bielesch

Oberkofler

Becker

et al. 2013

Nuclear Instruments and Methods in Physics Research Section B:

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In this paper well defined test samples are used to show how the analysis depth and the matrix material influence the depth resolution of nuclear reaction analysis. The reaction D(3 He, p)α is used to detect. The influence of the atomic number and the overlayer thickness on the depth resolution is studied by covering 10 nm thin deuterated amorphous carbon (a-C:D) films on silicon with tungsten (Z W =74) and titanium (Z Ti =22) of various thicknesses between 500 nm and 8 μm. The most probable depth profiles are calculated from the experimental data with the program NRADC, which implements Bayesian statistics. The resulting apparent layer width of the deuterium containing layer broadens with increasing thickness of the coating and this broadening is more pronounced for coatings with higher Z. These apparent layer widths are a measure for the achievable depth resolution. They are in good agreement with depth resolutions calculated with RESOLNRA. To investigate the Preprint submitted to Elsevier 8 November 2012 depth resolution of the p(15 N, α, γ) 12 C reaction, a 12 nm thin hydrogenated amorphous carbon (a-C:H) film on silicon and a pure tungsten sample are analysed. The width of the instrument function of this method is deduced from the surface hydrogen peak of the pure tungsten sample. The depth resolutions of the two NRAmethods are compared.

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Section: Introductionmentioning

confidence: 99%

“…The two most common reactions for detecting the hydrogen isotopes deuterium and protium are shown in equations (1) and (2).…”

Section: Introductionmentioning

confidence: 99%

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Experimental resolution of deuterium and hydrogen depth profiling with the nuclear reactions D(3He,p)α and p(15N,α,γ)12C

Bielesch

Oberkofler

Becker

et al. 2013

Nuclear Instruments and Methods in Physics Research Section B:

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Non-classical applications of chemical analysis based on nuclear activation

Grdeń

2019

J Radioanal Nucl Chem

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Oxidation of beryllium and exposure of beryllium oxide to deuterium plasmas in PISCES B

Roth¹,

Doerner²,

Baldwin³

et al. 2013

Journal of Nuclear Materials

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Abstract:The oxidation behaviour of Be in air was studied as a function of temperature. Below 660°C oxidation is limited by diffusion of Be through the growing BeO layer and closed oxide layers up to 100 nm thickness are formed. Above 660°C a rapid increase in the oxidation rate sets in.Secondary electron micrographs show that this fast oxidation goes along with massive structural changes of the surfaces.Oxidized samples were exposed on the witness-manipulator of PISCES-B to deuterium atoms reflected from a plasma-exposed W target. The energy of the reflected D was varied by changing the bias voltage on the W target (floating, -50 V and -100 V). The BeO temperature during exposure was varied between 20 and 250°C. The erosion of the exposed surfaces and the uptake of D were investigated by ion beam analysis. The retained amount of D increases with increasing bias voltage and decreasing exposure temperature. At room temperature saturation of the D concentration at about 12 at% in a surface layer correlated to the maximum particle range is observed. At temperatures above 100°C the concentration level decreases strongly, but retention spreads over the total oxide thickness.

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Optimized analysis of deuterium depth profiles in beryllium

Cited by 3 publications

References 17 publications

Experimental resolution of deuterium and hydrogen depth profiling with the nuclear reactions D(3He,p)α and p(15N,α,γ)12C

Experimental resolution of deuterium and hydrogen depth profiling with the nuclear reactions D(3He,p)α and p(15N,α,γ)12C

Non-classical applications of chemical analysis based on nuclear activation

Oxidation of beryllium and exposure of beryllium oxide to deuterium plasmas in PISCES B

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