“…Currently, many approaches have been proposed to detect and classify the textile fabric defects. Generally, these approaches can be divided into two kinds: one is based on the traditional machine learning methods (Hu et al, 2015;Liu et al, 2019;Shadika et al, 2017;Qing et al, 2018;Jing et al, 2013;Wang et al, 2018), which are mainly classified the textile fabric patterns by extracting low-level features of textile fabric images, like Scale-Invariant Feature Transform (CSIFT) (Qing et al, 2018), Fourier transform, wavelet transform (Yang et al, 2002(Yang et al, , 2004(Yang et al, , 2005, Gaussian mixture model (GMM) (Yu et al, 2010) combining extreme learning machine (ELM) (Liu et al, 2019;Qing et al, 2018), support vector machine (SVM) (Qing et al, 2018;Li and Cheng, 2014)and k-nearest neighbors (KNN), Bayesian classifiers (Habib et al, 2016), Euclidean distance, clustering and classification method of defect image classification, these methods can effectively solve the problem of a specific classification of textile fabric defect image, but due to the complexity of textile fabric defect, limited data samples and shallow features, these methods have poor generalization ability. For example, (Yang et al, 2005) the adaptive wavelets-based approach was expanded from the use of a single adaptive wavelet to multiple adaptive wavelets.…”