Opto-electronic Correlation Measurements on Damaged Si-on-sapphire Using Coplanar Waveguides

Abstract

The use of coplanar waveguide geometries to replace the more conventional microstrip transmission line arrangement used for sampling with photoconductive switches is discussed. It is shown that a significant reduction in the gap capacitance is achieved, improving the sampling time resolution to a point where the chief limitation is the pulse duration of the laser ( 3 ps).