2016
DOI: 10.1016/j.solmat.2015.10.039
|View full text |Cite
|
Sign up to set email alerts
|

Optoelectronic and material properties of nanocrystal-based CZTSe absorbers with Ag-alloying

Abstract: In this work, the benefits of Ag-alloying in kesterite solar cells are explored in terms of tunable band gap, improved grain growth, improved minority carrier lifetime, reduced defect formation, and reduced potential fluctuations for (Ag,Cu) 2 ZnSnSe 4 (ACZTSe) absorbers relative to Cu 2 ZnSnSe 4 (CZTSe). The enhanced optoelectronic properties are shown to scale here with the degree of Ag-alloying in ACZTSe. The impacts of these effects on device performance are discussed, with improvement in average device pe… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

10
86
1
5

Year Published

2016
2016
2024
2024

Publication Types

Select...
9

Relationship

2
7

Authors

Journals

citations
Cited by 131 publications
(102 citation statements)
references
References 46 publications
10
86
1
5
Order By: Relevance
“…First, no correlation between the measured PL decay times and device performance over a wide range (1%-12%) of device efficiencies (shown in Figure 2) and open-circuit voltage V OC (see the Supporting Information) can be found from published TRPL data. [5][6][7][8][9][10][11][12][13][14][15][16][17][18][19][20][21][22][23][24] These results are in contrast to that found from TRPL analysis of chalcopyrites and CdTe where a correlation with device efficiency and V OC is clear, as τ n is a measure of recombination losses. [33][34][35][36] However, for kesterites the connection between PL decay time and the assumed τ n is not apparent, as the reported decay times represent arbitrary measurement excitation conditions and data analysis procedures; characteristic decay times from a variety of fitting regions and techniques are reported for measured TRPL data.…”
Section: Introductioncontrasting
confidence: 92%
See 1 more Smart Citation
“…First, no correlation between the measured PL decay times and device performance over a wide range (1%-12%) of device efficiencies (shown in Figure 2) and open-circuit voltage V OC (see the Supporting Information) can be found from published TRPL data. [5][6][7][8][9][10][11][12][13][14][15][16][17][18][19][20][21][22][23][24] These results are in contrast to that found from TRPL analysis of chalcopyrites and CdTe where a correlation with device efficiency and V OC is clear, as τ n is a measure of recombination losses. [33][34][35][36] However, for kesterites the connection between PL decay time and the assumed τ n is not apparent, as the reported decay times represent arbitrary measurement excitation conditions and data analysis procedures; characteristic decay times from a variety of fitting regions and techniques are reported for measured TRPL data.…”
Section: Introductioncontrasting
confidence: 92%
“…Data are taken from refs. [5][6][7][8][9][10][11][12][13][14][15][16][17][18][19][20][21][22][23][24]. The solid lines represent device simulation results bounded by S F = 10 2 -10 6 cm s −1 and S B = 10 2 -10 7 cm s −1 ; the dashed line represents a lower bound on the efficiency for a reduced mobility gap E µ = E PL,Peak .…”
Section: Introductionmentioning
confidence: 99%
“…Specifically, we calculate the Urbach energy from the inverse slope of the linear portion in the sub-bandgap region of the plot between ln(−ln(1 − EQE)) and E − E g . [45] We extract an Urbach energy of ≈40-55 meV for all of the samples. Although the E U values are slightly overestimated due to inefficient charge-carrier collection at long wavelengths (see Section 2.4.3), the values measured here are consistent with those extracted from photothermal deflection spectroscopy measurements by Huang et al, where an E U of 53 meV was measured for both Cu 2 ZnSnS 4 and Cu 2 CdSnS 4 .…”
Section: Urbach Energymentioning
confidence: 99%
“…This observation suggests that there is a turning point in the curve of E g vs. Ag concentration, which explains the controversial observation of previous works, i.e., it is reported in ref. 17,18 and 20 that the band gap increases with the ratio of Ag/(Ag + Cu), but it is found in ref. 19 that the band gap decreases with the ratio of Ag/(Ag + Cu).…”
mentioning
confidence: 95%