1993
DOI: 10.1103/physreve.48.2713
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Ordering effects in thin smectic-C*films: An x-ray-reflectivity study

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Cited by 28 publications
(3 citation statements)
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“…In this paper, we calculated the densities of organic thin films according to Xiang et al’s method and X-ray reflectometry (XRR) analysis. The X-ray reflectometry (XRR) analysis has been used to investigate the properties of thin polymer films over recent decades. , XRR enables the determination of film density, thickness, and surface roughness. However, the study about the application of the X-ray reflectivity technique in analyzing the density measurement of small molecular thin films is relatively scarce .…”
Section: Resultsmentioning
confidence: 99%
“…In this paper, we calculated the densities of organic thin films according to Xiang et al’s method and X-ray reflectometry (XRR) analysis. The X-ray reflectometry (XRR) analysis has been used to investigate the properties of thin polymer films over recent decades. , XRR enables the determination of film density, thickness, and surface roughness. However, the study about the application of the X-ray reflectivity technique in analyzing the density measurement of small molecular thin films is relatively scarce .…”
Section: Resultsmentioning
confidence: 99%
“…The broadening of peak is due to hydrophilic-hydrophobic interaction of dodecyl chains. [37,38] 3.4 AFM imaging of LB films AFM imaging of LB films of (organic + nano) materials is usually done in non-contact mode. Because films of soft materials can get damaged during contact or intermittent mode.…”
Section: X-ray Diffractionmentioning
confidence: 99%
“…It is, however, not clear whether the droplets are superimposed on the bare substrate or on a specific tiny interfacial film [22][23][24]. The appearance of droplets is presumably related to the large cohesive energy of the material due to strong interactions of the molecular dipoles in successive layers.…”
Section: Introductionmentioning
confidence: 99%