2014
DOI: 10.1063/1.4867981
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Ordering of self-assembled 5-nm-diameter poly(dimethylsiloxane) nanodots with sub-10 nm pitch using ultra-narrow electron-beam-drawn guide lines and three-dimensional control

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Cited by 4 publications
(6 citation statements)
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“…The guide line height influences on the PS-PDMS thickness in the guide lines gap. It was clear that the PS-PDMS dot arrays formation began to be created in a region of more than 15 nm in the HSQ resist thickness for the guide lines [16]. Here, we set constant thickness of the coated HQS resist to about 25 nm in the EB drawing.…”
Section: Resultsmentioning
confidence: 99%
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“…The guide line height influences on the PS-PDMS thickness in the guide lines gap. It was clear that the PS-PDMS dot arrays formation began to be created in a region of more than 15 nm in the HSQ resist thickness for the guide lines [16]. Here, we set constant thickness of the coated HQS resist to about 25 nm in the EB drawing.…”
Section: Resultsmentioning
confidence: 99%
“…Here, we set constant thickness of the coated HQS resist to about 25 nm in the EB drawing. Furthermore, we used high resolution EB drawing with salty developer for HSQ resist to get steep side wall of the guide line [12], [16].…”
Section: Resultsmentioning
confidence: 99%
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“…Nanowires were fabricated on the prepared substrate by direct-write electron beam (EB) writing (Figure c,d). The EB writing system is a combination of a high-resolution scanning electron microscope (SEM) with a Schottky emission-type field-emission electron gun (JSM6500F, JEOL) and a drawing controller (Beam Draw, Tokyo Technology) . To form narrow nanowires with high-resolution, negative-tone resist hydrogen silsesquioxane (HSQ, Dow Corning) and a high-contrast salty development solution , were employed.…”
Section: Methodsmentioning
confidence: 99%
“…The EB writing system is a combination of a highresolution scanning electron microscope (SEM) with a Schottky emission-type field-emission electron gun (JSM6500F, JEOL) and a drawing controller (Beam Draw, Tokyo Technology). 40 To form narrow nanowires with high-resolution, negative-tone resist hydrogen silsesquioxane (HSQ, Dow Corning) and a high-contrast salty development solution 41,42 were employed. Normally, a thin HSQ resist layer would be employed to form a high-resolution pattern because the EB scattering range (lateral) in a thin resist layer is smaller than that in a thick resist layer.…”
Section: Methodsmentioning
confidence: 99%