2016
DOI: 10.1038/pj.2016.2
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Orientation and relaxation behaviors of lamellar microdomains of poly(methyl methacrylate)-b-poly(n-butyl acrylate) thin films as revealed by grazing-incidence small-angle X-ray scattering

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Cited by 12 publications
(4 citation statements)
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“…GISAXS data were collected using a 10 s integration time and a grazing-incidence angle of 0.10°. This angle is above the critical angle (∼0.096°), and the calculated penetration depth was ∼10 5 nm, indicating that the entire film is sampled in all GISAXS measurements. This assessment is supported by L measurements by GISAXS for the 114 nm thick 22 kg/mol HP blend film at the same position while using different incidence angles above the critical angle.…”
Section: Experimental Methodsmentioning
confidence: 89%
“…GISAXS data were collected using a 10 s integration time and a grazing-incidence angle of 0.10°. This angle is above the critical angle (∼0.096°), and the calculated penetration depth was ∼10 5 nm, indicating that the entire film is sampled in all GISAXS measurements. This assessment is supported by L measurements by GISAXS for the 114 nm thick 22 kg/mol HP blend film at the same position while using different incidence angles above the critical angle.…”
Section: Experimental Methodsmentioning
confidence: 89%
“…Various SVA setups have been designed to precisely control the processing parameters, e.g., the annealing temperature, making the method a reliable way to process block copolymer thin films for applications. [ 19–27 ] In situ experiments [ 28–32 ] and simulation studies [ 33–37 ] have been performed to elucidate the structural changes during SVA and thus to improve the understanding of the annealing process, resulting in more powerful processing protocols.…”
Section: Figurementioning
confidence: 99%
“…With nGISAXS, the X-ray beam size is decreased further (as small as 300 nm diameter) to probe the through-film profile across localized areas [121]. To improve contrast between domains, GI-RSoXS incorporates low-energy, or "soft" X-rays to measure depth-resolved structure and composition profiles [168,169]. Additionally, as an alternative to traditional GISAXS, CDSAXS examines buried interfaces by collecting 2D profiles from multiple transmission scattering angles to construct a 3D reciprocal-space map of periodic nanostructures [170][171][172].…”
Section: Transmission X-ray Scattering For In-plane Analysis Of Thin mentioning
confidence: 99%