2008
DOI: 10.1016/j.apsusc.2008.07.182
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Orientation dependence of electrical properties for Bi4−xNdxTi3O12 (x=0.85) thin film deposited on p-type Si(100) substrate

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Cited by 4 publications
(1 citation statement)
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“…As we expected, the P r value of the as-prepared BNT film with the high c -axis orientation was 20.8 μC/cm 2 . It was higher than that of BIT film, and comparable with those similar materials deposited onto other substrates 50, 51 . However, the highest P r record of 51.5 μC/cm 2 was achieved in the c -axis oriented BNT thin film, which was deposited onto Pt/TiO 2 /SiO 2 /Si via a CSD process 7 .…”
Section: Resultssupporting
confidence: 83%
“…As we expected, the P r value of the as-prepared BNT film with the high c -axis orientation was 20.8 μC/cm 2 . It was higher than that of BIT film, and comparable with those similar materials deposited onto other substrates 50, 51 . However, the highest P r record of 51.5 μC/cm 2 was achieved in the c -axis oriented BNT thin film, which was deposited onto Pt/TiO 2 /SiO 2 /Si via a CSD process 7 .…”
Section: Resultssupporting
confidence: 83%