2008
DOI: 10.1002/sia.2886
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Orientation‐dependent surface composition of in situ annealed strontium titanate

Abstract: The surface composition of polycrystalline niobium-doped strontium titanate (SrTiO 3 : Nb) is studied using X-ray photoelectron emission microscopy (XPEEM) for many grain orientations in order to characterise the surface chemistry with high spatial resolution. The surface sensitivity is maximised by the use of soft X-ray synchrotron radiation (SR). The grain orientation is determined by electron backscattering diffraction (EBSD). Stereographic plots are used to show the correlation between surface composition … Show more

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Cited by 24 publications
(25 citation statements)
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“…It is possible that the surface termination in Ti‐rich material is different from Sr‐rich material, hindering diffusion into the contact areas. The surface termination of the particles can rearrange at temperatures as low as 800°C 17 to form a more stable surface compared with the one resulting from the milling procedure. The enhanced neck formation in the low temperature regime for the Sr‐rich compositions indicates that Ti termination of the surfaces in the Ti‐rich materials inhibits the diffusion to the contact areas (Fig.…”
Section: Discussionmentioning
confidence: 99%
“…It is possible that the surface termination in Ti‐rich material is different from Sr‐rich material, hindering diffusion into the contact areas. The surface termination of the particles can rearrange at temperatures as low as 800°C 17 to form a more stable surface compared with the one resulting from the milling procedure. The enhanced neck formation in the low temperature regime for the Sr‐rich compositions indicates that Ti termination of the surfaces in the Ti‐rich materials inhibits the diffusion to the contact areas (Fig.…”
Section: Discussionmentioning
confidence: 99%
“…Random charges may result from adsorption of contaminants and/or the presence of impurities that can generate surface charges which depend strongly on the method of preparation of the samples. Surface charge disorder may also originate from the variation of the local crystallographic axes of the exposed surface of a clean polycrystalline sample which induces a variation of the local surface potential [3,4,2]. The heterogeneous structure of the charge disorder on dielectric surfaces and thus its statistical properties can be determined directly from Kelvin force microscopy measurements [1].…”
Section: Introductionmentioning
confidence: 99%
“…The values were shifted by 0.98 eV compensating for the Schottky effect. 36 The dispersion relationship for the top valence band structure centered on the Γ point (k // = 0 Å −1 ) was obtained by first averaging the E bin vs. k slices of the k-PEEM image stack along the three equivalent MGM′ directions. Then, each constant-k intensity curve was fitted with a Gaussian peak yielding a peak position which was used to trace the dispersion relationship in the range of the inverted structure (E B = 0.86-0.91 eV; k // = 0-0.15 Å…”
Section: Photoemission Electron Momentum Microscopymentioning
confidence: 99%