2017
DOI: 10.1016/j.scriptamat.2017.07.003
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Orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy

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Cited by 14 publications
(6 citation statements)
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“…Practically, the process of directly determining the orientation (the inverse problem) is difficult to solve, so a fitting algorithm is used instead [12]. The outcome of the implemented algorithm can be used to create inverse pole figures-there have been a number of past publications comparing obtained crystallographic grain orientation information using the SRAS technique against electron backscatter diffraction (EBSD) [13][14][15][16][17]. If the interrogation area is larger than the crystallographic grain size, then the predominant velocity in the area is measured-the material texture is imaged instead [9,10].…”
Section: Spatially Resolved Acoustic Spectroscopymentioning
confidence: 99%
See 1 more Smart Citation
“…Practically, the process of directly determining the orientation (the inverse problem) is difficult to solve, so a fitting algorithm is used instead [12]. The outcome of the implemented algorithm can be used to create inverse pole figures-there have been a number of past publications comparing obtained crystallographic grain orientation information using the SRAS technique against electron backscatter diffraction (EBSD) [13][14][15][16][17]. If the interrogation area is larger than the crystallographic grain size, then the predominant velocity in the area is measured-the material texture is imaged instead [9,10].…”
Section: Spatially Resolved Acoustic Spectroscopymentioning
confidence: 99%
“…To obtain the SAW phase velocities, the mask is rotated in order to propagate the generated surface waves in different directions-the detection laser also follows with the rotating pattern. Using the described generation and detection lasers, this setup has been used to image the microstructure of titanium, nickel, steel and aluminium based alloys [13][14][15]20], as well as non-metallic materials such as polycrystalline silicon samples (once a metallic coating is applied) [16].…”
Section: Spatially Resolved Acoustic Spectroscopymentioning
confidence: 99%
“…Seismological applications of surface waves [ 7 ] include the detection of subsurface anomalies such as tunnels [ 8 ] and mineral deposits [ 9 ] as well as investigations of the evolution of planetary crusts [ 10 , 11 ]. Current applications in materials science include the non-destructive testing of polycrystalline materials [ 12 ] such as silicon for solar cells [ 13 ]. Large engineered structures made of metals [ 14 , 15 ] and concrete [ 16 ] are also inspected for crack formation and growth using surface waves in order to prevent catastrophic failures.…”
Section: Introductionmentioning
confidence: 99%
“…In addition, it generates a separate optical map of the surface being inspected. Previously, SRAS has been used to measure the grain orientation of large-grained materials such as nickel, titanium and silicon [8][9][10] . As an NDT technique, SRAS is uniquely placed to address many of the challenges instigated by SLM.…”
Section: Introductionmentioning
confidence: 99%