Orientation Stereology—A New Branch in Texture Research

Bunge, H. J.; Schwarzer, Robert

doi:10.1002/1527-2648(200101)3:1/2<25::aid-adem25>3.0.co;2-8

Cited by 42 publications

(21 citation statements)

References 28 publications

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“…The future of quantitative texture analysis may involve the incorporation of the additional dimensionalities of spatiality, lattice defects and residual stress into a complete microstructure distribution function, G(x) [75]. Thus, micron-size-scale diffraction techniques for measuring the spatial distribution of grain and domain orientations will become necessary in the near future.…”

Section: Crystallographic Texturementioning

confidence: 99%

The use of diffraction in the characterization of piezoelectric materials

Jones

2007

J Electroceram

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X-ray and neutron diffraction have become powerful characterization tools in materials research. Their leading use in the characterization of piezoelectric ceramics includes the determination of structure, phase evolution, crystallographic texture, and lattice strain. The inherent electromechanical coupling of piezoelectric materials also allows the direct characterization of the converse piezoelectric effect. New advances in diffraction capabilities have recently enabled new problem solutions within this field. For example, the use of microdiffraction has the potential to characterize structural defects including cracks and domain walls. The development of time-resolved techniques has further opened doors to characterizing ferroelectrics in real-time under the application of cyclic electric fields. These recent advances as well as traditional uses of X-ray and neutron diffraction in the characterization of piezoelectric materials and the phenomenon of piezoelectricity are explored in this review. A focus is on characterization of bulk, polycrystalline ceramics, though novel approaches in thin films and single crystals are also reviewed. Challenges and future opportunities are discussed.

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Section: Crystallographic Texturementioning

confidence: 99%

The use of diffraction in the characterization of piezoelectric materials

Jones

2007

J Electroceram

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“… Influence of micro‐anisotropy of the crystals on the macro‐anisotropy of the material, after Bunge and Schwarzer 96 …”

Section: Introductionmentioning

confidence: 99%

Texture and Anisotropy of Polycrystalline Piezoelectrics

Jones

Iverson

Bowman

2007

Journal of the American Ceramic Society

101

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Piezoelectricity is manifested in ferroelectric ceramics by inducing a preferred volume fraction of one ferroelectric domain variant orientation at the expense of degenerate orientations. The piezoelectric effect is therefore largely controlled by the effectiveness of the electrical poling in producing a bias in ferroelectric (180°) and ferroelastic (non‐180°) domain orientations. Further enhancement of the piezoelectric effect in bulk ceramics can be accomplished by inducing preferred orientation through grain‐orientation processes such as hot forging or tape casting that precede the electrical‐poling process. Coupled crystal orientation and domain orientation processing yields ceramics with an even greater piezoelectric response. In this paper, preferred orientations of domains and grains in polycrystalline piezoelectric ceramics generated through both domain‐ and grain‐orientation processing are characterized through pole figures and orientation distribution functions obtained using data from a variety of diffraction techniques. The processing methods used to produce these materials and the methods used to evaluate preferred orientation and texture are described and discussed in the context of prior research. Different sample and crystal symmetries are explored across a range of commercial and laboratory‐prepared materials. Some of the variables presented in this work include the effects of in situ thermal depoling and the detailed processing parameters used in tape casting of materials with preferred crystallite orientations. Preferred orientation is also correlated with anisotropic properties, demonstrating a clear influence of both grain and domain orientations on piezoelectricity.

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“…From these parameters, the grain size and shape can also be obtained, yielding the complete orientation stereology of the polycrystalline aggregate. [4] For the high location resolution case, the intensity at any point of the diagrams corresponds to a pole density as a function of {v,g,y,z}; it is always projected over an angle c around the diffraction vector and the coordinate x in the beam direction.…”

Section: Discussionmentioning

confidence: 99%

“…[1] The complete description of a polycrystalline aggregate is given by the orientation stereology g(x) which specifies the orientation g in any small volume element at a local position x. [4,13] The orientation stereology can be measured with the scanning electron microscopy (SEM) technique of orientation imaging microscopy, which is also called orientation topology. [2,3] However, this yields only a two-dimensional section of the function g(x) at the sample surface and is not suited to measurement of the kinetics g(x,t) of the three-dimensional orientation stereology function, for example, during recrystallization processes, particularly not in the interior of the material.…”

Section: Introductionmentioning

confidence: 99%

Principles of Highly Resolved Determination of Texture and Microstructure using High‐Energy Synchrotron Radiation

Klein

2009

Adv Eng Mater

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Diffraction imaging with hard X‐rays (high‐energy synchrotron radiation) using the detector sweeping techniques allows measurement of the texture and microstructure of polycrystalline materials with high orientation‐ and location‐resolution. These techniques provide continuous two‐dimensional images of different sections and projections of the six‐dimensional “orientation‐location” space. For the high orientation resolution case, it is possible to measure the orientation and location coordinates of up to 105 individual grains simultaneously. From these parameters, the grain size and shape can also be obtained, yielding the complete orientation stereology of the polycrystalline aggregate, which is required for its complete characterization. For the high location resolution case, the intensity at any point of the diagrams corresponds to a pole density as a function of the orientation‐location space.

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Orientation Stereology—A New Branch in Texture Research

Cited by 42 publications

References 28 publications

The use of diffraction in the characterization of piezoelectric materials

The use of diffraction in the characterization of piezoelectric materials

Texture and Anisotropy of Polycrystalline Piezoelectrics

Principles of Highly Resolved Determination of Texture and Microstructure using High‐Energy Synchrotron Radiation

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