Orientational changes during the surface crystallisation of cordierite from a B2O3/Al2O3/MgO/SiO2 glass

Wisniewski, Wolfgang; Baptista, C. A. R. P.; Rüssel, Christian

doi:10.1039/c2ce25293g

Cited by 15 publications

(26 citation statements)

References 24 publications

(62 reference statements)

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“…1 and the results presented in Fig. 2, the strong tendency of these cordierite phases to nucleate at the surface14041 and the composition of the initial glass, the most logical explanation for these observations is that indialite was the last phase to crystallize. It probably grew along connected channels of residual glass formed by the growth of the YS-phases and thus filled large surface areas which do not appear to be connected at the immediate surface.…”

Section: Discussionmentioning

confidence: 66%

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Surface Crystallization of a MgO/Y2O3/SiO2/Al2O3/ZrO2 Glass: Growth of an Oriented β-Y2Si2O7 Layer and Epitaxial ZrO2

Wisniewski

Seidel

Patzig

et al. 2017

Sci Rep

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The crystallization behavior of a glass with the composition 54.7 SiO2·10.9 Al2O3·15.0 MgO·3.4 ZrO2·16.0 Y2O3 is studied using X-ray diffraction (XRD), scanning electron microscopy (SEM) including electron backscatter diffraction (EBSD) and (scanning) transmission electron microscopy [(S)TEM] including energy-dispersive X-ray spectrometry (EDXS). This glass shows the sole surface crystallization of four different yttrium silicates of the composition Y2Si2O7 (YS). The almost simultaneous but independent nucleation of α-, β-, δ-, and ε-YS at the surface is followed by growth into the bulk, where ε-YS quickly dominates a first crystallized layer. An accumulation of Mg at the growth front probably triggers a secondary nucleation of β-YS, which forms a thin compact layer before fragmenting into a highly oriented layer of fine grained crystals occupying the remaining bulk. The residual glass between the YS growth structures allows the crystallization of indialite, yttrium stabilized ZrO2 (Y-ZrO2) and very probably μ-cordierite during cooling. Hence, this glass basically shows the inverted order of crystallization observed in other magnesium yttrium alumosilicate glasses containing less Y2O3. An epitaxial relationship between Y-ZrO2 and ε-YS is proven and multiple twinning relationships occur in the YS phases.

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Section: Discussionmentioning

confidence: 66%

“…By contrast, a systematic orientation change has been observed in indialite crystals grown in a boron doped MgO/Al 2 O 3 /SiO 2 (MAS) glass41. Comparably small orientation changes and a topography were observed in indialite containing domains after crystallization in a related MAS system free of Y 2 O 3 1.…”

Section: Discussionmentioning

confidence: 92%

Surface Crystallization of a MgO/Y2O3/SiO2/Al2O3/ZrO2 Glass: Growth of an Oriented β-Y2Si2O7 Layer and Epitaxial ZrO2

Wisniewski

Seidel

Patzig

et al. 2017

Sci Rep

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“…[7][8][9][10]. The recent application of electron backscatter diffraction (EBSD) to the surface crystallization of cordierite [11,12] has confirmed some previous results such as statistical crystal nucleation at the surface and a glass skin covering these topmost crystals [13,14]. Some new insights into local orientations and orientation development during growth were also provided.…”

Section: Introductionmentioning

confidence: 60%

“…Pattern b) clearly indicates μ-cordierite and a number of indialite peaks also occur while the main indialite peak is not observed. The absence of the main indialite peak also occurred in boron containing glasses after crystallizing indialite at 1050°C [12]. The proposed Xphase is not indicated again, but there are three notable peaks marked "?"…”

Section: 2mentioning

confidence: 94%

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Analysis of the cordierite X-phase and phase transformation by electron backscatter diffraction (EBSD)

Wisniewski

Rüssel

2014

Journal of Non-Crystalline Solids

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An experimental viewpoint on the information depth of EBSD

Wisniewski

Rüssel

2015

Scanning

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This article contains a critical review of the literature concerning the information depth of electron backscatter diffraction (EBSD) and a viewpoint on the topic is formulated. EBSD is applied to a crystal partially covered by a wedge of amorphous glass. EBSD-patterns of decreasing quality are obtained from a crystal covered by an increasingly thick layer of glass. The location of the last indexable EBSD-patterns is compared to the last discernible contrast in SEM-micrographs obtained from the same crystal using accelerating voltages of 2-20 kV. It is concluded that the information depth of EBSD is at least as large as that of an SEM-micrograph obtained with a voltage of 4 kV from a non-tilted sample. Concepts of the information depth and experimental approaches are discussed.

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Orientational changes during the surface crystallisation of cordierite from a B2O3/Al2O3/MgO/SiO2 glass

Cited by 15 publications

References 24 publications

Surface Crystallization of a MgO/Y2O3/SiO2/Al2O3/ZrO2 Glass: Growth of an Oriented β-Y2Si2O7 Layer and Epitaxial ZrO2

Surface Crystallization of a MgO/Y2O3/SiO2/Al2O3/ZrO2 Glass: Growth of an Oriented β-Y2Si2O7 Layer and Epitaxial ZrO2

Analysis of the cordierite X-phase and phase transformation by electron backscatter diffraction (EBSD)

An experimental viewpoint on the information depth of EBSD

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