A new numerical noise model for uniformly doped GaAs MESFET photodetector has been proposed, which is compatible with small signal equivalent circuit and large signal current voltage characteristics. A model has been developed for computation of different noises such as shot noise, thermal noise and diffusion noise present in GaAs metal-semiconductor field effect transistor (MES-FET) in the nano meter region. The potential profile, electric field, mobility and from that the current voltage characteristics have also been calculated by solving the Poisson's Equation numerically. The different noise components and also their correlation components both at the gate end and the drain end have been computed for the two port small signal noise equivalent circuit of the GaAs MESFET photodetector to study the overall noise performance. Signal-to-noise ratio (SNR) and Bit error rate (BER) and the noise equivalent power (NEP) have also been calculated, showing a good agreement with the existing results. Our model is simple and physical enough for device design and circuit simulation especially for OEIC applications. The operating frequency can be adjusted suitably to make the noise behavior of the MESFET independent of the value of the incident optical power.