Articles you may be interested inElectron-phonon coupling modification and carrier mobility enhancement in poly (3,4-ethylenedioxythiophene) doped with poly(4-styrenesulfonate) films by ultraviolet irradiation J. Appl. Phys. 116, 093707 (2014); 10.1063/1.4894836 Direct electrostatic toner marking with poly(3,4-ethylenedioxythiophene)polystyrenesulfonate bilayer devices J. Appl. Phys. 112, 074506 (2012); 10.1063/1.4756041 Carrier transport mechanism of poly(3,4-ethylenedioxythiophene) doped with poly(4-styrenesulfonate) films by incorporating ZnO nanoparticles Appl. Phys. Lett. 100, 253302 (2012); 10.1063/1.4730391 Reduced conductivity in poly(3,4-ethylenedioxythiophen)-poly(styrene sulfonate) and indium tin oxide nanocomposite for low indium tin oxide content J. Appl. Phys. 105, 054318 (2009); 10.1063/1.3080154Electronic structure of poly(1,10-phenanthroline-3,8-diyl) and its K-doped state studied by photoelectron spectroscopyWe report electron spin resonance (ESR) and electrical transport measurements in pristine poly(3,4-ethylenedioxythiophene) doped with poly(styrenesulphonate) (PEDOT:PSS) films and ethylene glycol (EG)-treated PEDOT:PSS films. Based on the assumption that ESR from PEDOT:PSS is mainly due to hole polarons, we estimated the polaron mobility in the PEDOT:PSS films as l p % 0:1-1 cm 2 V À1 s À1 . We also estimated that bipolaron mobilities are in the range of approximately 10-100 cm 2 V À1 s À1 , assuming that the initial hole density is unaffected by bipolaron formation. We measured transient currents following application of voltage bias in several films, which had the features of space-charge limited currents despite being measured with coplanar electrodes. The relative nominal mobilities obtained for hole polarons in PEDOT:PSS and for bipolarons in EG-PEDOT:PSS were not inconsistent with the results obtained from the ESR and conductivity measurements. However, although the inferred mobility was voltage-independent for untreated samples with hole polarons, the inferred mobility increased steeply with the applied voltage, consistent with exp ð ffiffiffi ffi V p Þ behavior, for EG-treated samples. V C 2015 AIP Publishing LLC.