Low‐energy electron microscopy (LEEM) is a powerful method to study solid surfaces, thin films, and other surface‐supported nanostructures. Among the assorted electron‐based microscopies that are available, LEEM stands out for its strong surface sensitivity, real‐time imaging capability, and a number of unique contrast mechanisms that exploit the wave nature of imaging electrons. Furthermore, the capability to provide complementary reciprocal space information on a very small length scale using micro‐low energy electron diffraction in a LEEM brings many added strengths. LEEM is an ultrahigh vacuum technique, in which numerous approaches to in situ surface modification can be performed during imaging. These capabilities allow the study of structure, morphology and dynamic processes with excellent spatial and temporal resolution.