Orthogonal time‐of‐flight secondary ion mass spectrometric analysis of peptides using large gold clusters as primary ions

Tempez, A.; Schultz, J.; Della‐Negra, S.; Depauw, J.; Jacquet, D.; Новиков, А. В.; LeBeyec, Y.; Pautrat, M.; Caroff, Martine; Ugarov, M. V.; Bensaoula, Hakim; Gonin, Marc; Führer, Katrin; Woods, Amina S.

doi:10.1002/rcm.1342

Cited by 88 publications

(85 citation statements)

References 30 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Au 4þ 400 cluster ions were first introduced by Tempez et al (2004) where the authors used both small and large gold clusters to characterize peptide samples. It was demonstrated in this work that there were significant signal enhancements as well as decreased damage cross sections when using the Au .…”

Section: E Massive Au Clustersmentioning

confidence: 99%

Cluster secondary ion mass spectrometry of polymers and related materials

Mahoney

2009

Mass Spectrometry Reviews

283

329

View full text Add to dashboard Cite

Cluster secondary ion mass spectrometry (cluster SIMS) has played a critical role in the characterization of polymeric materials over the last decade, allowing for the ability to obtain spatially resolved surface and in-depth molecular information from many polymer systems. With the advent of new molecular sources such as C(60)(+), Au(3)(+), SF(5)(+), and Bi(3)(+), there are considerable increases in secondary ion signal as compared to more conventional atomic beams (Ar(+), Cs(+), or Ga(+)). In addition, compositional depth profiling in organic and polymeric systems is now feasible, without the rapid signal decay that is typically observed under atomic bombardment. The premise behind the success of cluster SIMS is that compared to atomic beams, polyatomic beams tend to cause surface-localized damage with rapid sputter removal rates, resulting in a system at equilibrium, where the damage created is rapidly removed before it can accumulate. Though this may be partly true, there are actually much more complex chemistries occurring under polyatomic bombardment of organic and polymeric materials, which need to be considered and discussed to better understand and define the important parameters for successful depth profiling. The following presents a review of the current literature on polymer analysis using cluster beams. This review will focus on the surface and in-depth characterization of polymer samples with cluster sources, but will also discuss the characterization of other relevant organic materials, and basic polymer radiation chemistry.

show abstract

Section: E Massive Au Clustersmentioning

confidence: 99%

Cluster secondary ion mass spectrometry of polymers and related materials

Mahoney

2009

Mass Spectrometry Reviews

283

329

View full text Add to dashboard Cite

show abstract

“…During removal of material from the sample, chemical damage accumulation normally associated with atomic bombardment is largely avoided, and molecular ion signals persist even after extended periods of ion bombardment. Projectiles with larger numbers of atoms such as C 60 ϩ and Bi 7 ϩ often leave less accumulated damage than clusters with less numbers of atoms, such as Au 3 ϩ and Bi 3 ϩ [5,9,15]. It has been proposed that when combining molecular depth profiling with imaging etching should be performed with the C 60 source, and images should be acquired with the LMIG source due to its higher lateral resolution [1,13,15].…”

mentioning

confidence: 99%

Direct comparison of Au₃⁺ and C₆₀⁺ cluster projectiles in SIMS molecular depth profiling

Cheng

Kozole

Hengstebeck

et al. 2007

J. Am. Soc. Mass Spectrom.

View full text Add to dashboard Cite

The sputtering properties of two representative cluster ion beams in secondary ion mass spectrometry (SIMS), C 60 ϩ and Au 3 ϩ , have been directly compared. Organic thin films consisting of trehalose and dipalmitoylphosphatidylcholine (DPPC) are employed as prototypical targets. The strategy is to make direct comparison of the response of a molecular solid to each type of the bombarding cluster by overlapping the two ion beams onto the same area of the sample surface. The ion beams alternately erode the sample while keeping the same projectile for spectral acquisition. The results from these experiments are important to further optimize the use of cluster projectiles for SIMS molecular depth profiling experiments. For example, Au 3 ϩ bombardment is found to induce more chemical damage as well as Au implantation when compared with C 60 ϩ . Moreover, C 60 ϩ is found to be able to remove the damage and the implanted Au effectively. Discussions are also presented on strategies of enhancing sensitivity for imaging applications with cluster SIMS. (J Am Soc Mass Spectrom 2007, 18, 406 -412) © 2007 American Society for Mass Spectrometry E nergetic cluster ion bombardment and secondary ion mass spectrometry (SIMS) experiments have opened new applications in molecular depth profiling and 3D chemical imaging [1][2][3]. With this approach, it has been reported for many systems, that cluster projectiles remove large amounts of material from molecular solids without the damage accumulation associated with atomic projectiles [4 -12]. Moreover, erosion of the material occurs without significant interlayer mixing and/or the formation of topographical features, allowing depth resolution of 10 to 30 nm to be achieved [8 -10]. These attributes have compelled a majority of SIMS workers to quickly adopt this new technology.Although many different cluster projectiles have been examined, practical considerations have led to wide adaptation of liquid metal ion sources consisting of Au or Bi projectiles (Au 3 ϩ and Bi 3 ϩ , respectively) [13][14][15][16], and gas ion sources consisting of SF 5 ϩ or C 60 ϩ projectiles [6,17,18]. The physics of the ion/solid interaction is likely to be quite different between the carbon and metal-type sources since at 20 keV incident energy, each carbon atom carries 333 eV of kinetic energy while each metal atom in a trimer carries 6667 eV of kinetic energy. Moreover, there is a large mass variation between the atoms comprising these cluster species.The imaging capability of the two types of sources is quite different. The liquid metal ion gun (LMIG) technology yields very bright ion beams with a probe size of less than 100 nm in diameter [19]. The gas ion source requires apertures to define the beam size, sacrificing beam current. Recently, a C 60 source has been introduced [20] that achieves a submicron probe size with enough current to acquire images in a reasonable amount of time. In general, however, higher lateral resolution is achieved with the LMIG design if there is enough sensitivity in the mass...

show abstract

“…[15] A new way was thus opened to increase the molecular ion emission yields by a factor 1000 compared to those obtained by the bombardment with an atomic projectile [16] at low energy. Moreover, the damage cross-section measurements for different cluster beams including massive clusters show clearly a low damage cross-section for Au 400 4+ , [16] and the ratio between the molecular ion emission yield and damage cross-section increases with the energy and the mass of the cluster. [17] Recently, a study of the influence of the projectile energy from 20 qkeV to 4 qMeV [18] permits to reach ion emission rates higher than a few tens of molecular ions per impact.…”

Section: Introductionmentioning

confidence: 99%

The Pegase project, a new solid surface probe: focused massive cluster ion beams

Della‐Negra

Arianer

Depauw

et al. 2011

Surface & Interface Analysis

Self Cite

View full text Add to dashboard Cite

International audienceThe objective of this project is the development of the SIMS associated to a new probe of the solid: massive clusters consisting of 100–1000 bismuth or gold atoms. The systematic study of the ionic emission intensities as a function of the mass and energy of these projectiles showed that 100–200 qkeV is sufficient energy for the new probe. It is possible to obtain a time of flight (ToF) spectrum with a single impact. These spectra permit to characterize light molecules (MW∼ a few hundreds) with their fragments and intact molecular ion peaks. To analyze the surface, we propose to obtain cluster beams of 100–150 qkeV with a diameter of 10–100 µm, and to associate measurements of time of flight mass spectrometry with the detection of electron emission in order to locate the impact on the surface. We describe the simulation and the installation, on a 130 kV platform, of our column including a LMIS (Liquid Metal ion Source), lenses and Wien Filter, and of a focusing beam line made of an accelerating gap with its shield and a 130 kV insulator. We shall give the experimental beam specifications obtained with the massive cluster ion source Pegase for bismuth and gold

show abstract

Orthogonal time‐of‐flight secondary ion mass spectrometric analysis of peptides using large gold clusters as primary ions

Cited by 88 publications

References 30 publications

Cluster secondary ion mass spectrometry of polymers and related materials

Cluster secondary ion mass spectrometry of polymers and related materials

Direct comparison of Au₃⁺ and C₆₀⁺ cluster projectiles in SIMS molecular depth profiling

The Pegase project, a new solid surface probe: focused massive cluster ion beams

Contact Info

Product

Resources

About

Orthogonal time‐of‐flight secondary ion mass spectrometric analysis of peptides using large gold clusters as primary ions

Cited by 88 publications

References 30 publications

Cluster secondary ion mass spectrometry of polymers and related materials

Cluster secondary ion mass spectrometry of polymers and related materials

Direct comparison of Au3+ and C60+ cluster projectiles in SIMS molecular depth profiling

The Pegase project, a new solid surface probe: focused massive cluster ion beams

Contact Info

Product

Resources

About

Direct comparison of Au₃⁺ and C₆₀⁺ cluster projectiles in SIMS molecular depth profiling