Orthogonality Sampling Method for the Electromagnetic Inverse Scattering Problem

Abstract

This paper is concerned with the electromagnetic inverse scattering problem that aims to determine the location and shape of anisotropic scatterers from far field data (at a fixed frequency). We study the orthogonality sampling method which is a simple, fast and robust imaging method for solving the electromagnetic inverse shape problem. We first provide a theoretical foundation for the sampling method and a resolution analysis of its imaging functional. We then establish an equivalent relation between the orthogonality sampling method and direct sampling method as well as resolution analysis for the latter. The analysis uses the Factorization Method for the far field operator and it plays an important role in the justifications along with the Funk-Hecke integral identity. Finally, we present some numerical examples to validate the performance of the sampling methods for anisotropic scatterers in three dimensions.