Oscillation-Based Test Applied to a Wideband CCII

Abstract

Oscillation-based testing (OBT) has been proven to be a simple, yet effective VLSI test for numerous circuit types. This paper investigates, for the first time, the application of OBT verification for second generation current conveyors (CCIIs). The OBT is formed by connecting the CCII into a simple Wien bridge oscillator and monitoring both the amplitude and frequency of oscillation. The fault detection rate, taking into account both the open and short circuit fault simulation analyses, indicates 96.34% fault coverage using a combination of amplitude and frequency output sensing in all technology corners. The only nondetected faults are short circuits between DD and SS , which can be detected using other techniques such as IDDQ testing. This method is found to be sensitive to resistor and capacitor process variation in the Wien bridge oscillator, but mitigating test steps are proposed.

Influence of PVT Variation and Threshold Selection on OBT and OBIST Fault Detection in RFCMOS Amplifiers

“…Open-circuit (OC) and short-circuit (SC) faults are considered, with OC faults modelled with a 1 MΩ resistor (replacing the conducting node) and SC faults modelled with a 10 Ω resistor between two nodes. This matches the approach used previously [19], [27], [31], [40], with the only difference being the choice of 1 MΩ resistor for the OC, as opposed to 10 MΩ previously, to ensure correspondence to the previous paper [40]. Based on the results in [31], this change is not expected to influence the test results.…”

“…The most common way of evaluating OBT circuits is by evaluating them over single-catastrophic or single-deviation fault models [19]- [21], [26], [27], [31], [40], enabling the use of fault coverage to evaluate the efficacy of the testing strategy. This is often augmented by Monte Carlo analysis of both faulty and non-faulty circuits [58] to evaluate the test approach over PVT variation.…”

“…OBT and OBIST have been applied to a wide variety of analogue and mixed-signal (AMS) CMOS circuits, including operational transimpedance amplifiers (OTAs) [28], [29] and OTA-based filters [30], second-generation current conveyors (CCIIs) [31] and CCII-based filters [32], conventional op-amps [33], switched capacitor filters [34], [35], digital circuits such as digital filters [36], full AMS blocks [37] and phase shifters [38].…”

Oscillation-based test in a CCII-based bandpass filter

“…3, the circuit is passed as fault-free. This margin has previously shown to account adequately for process variation [16][17][18][19] without passing faulty circuits. Tables 3 and 4 present the simulation results for short circuit and open circuit faults, respectively, both for 0.35μm CMOS.…”

“…The CCII used in this filter is presented in [15], with [16] providing an in-depth OBT study of the CCII in isolation. The transistor-level schematic of the filter is depicted in Fig.…”