Abstract:The electrical resistivity p(d, T ) of single-crystalline copper whiskers with diameters d between 7 and 8 1 p n and residual electron mean free path I, = 240 pm has been measured in the temperature range 0.4 K g Tg4.2 K. The magnitude of the temperaturedependent part Ap(d, T ) turns out to increase linearly with the residual resistivity, p(d, 0), of the samples. Moreover Ap(d, T ) is found to be substantially smaller after the sample surfaces had been roughened by chemical etching. These results are in quanti… Show more
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