Oscillatory regime of ordering during interdiffusion

Гусак, А. М.; Ковальчук, А. О.

doi:10.1103/physrevb.58.2551

Cited by 12 publications

(7 citation statements)

References 8 publications

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“…Nanoscience and nanotechnology has been established as an important area, which makes it equally important to characterize these materials which were considered amorphous for long. , At the junction of the (poly-)crystalline and amorphous, in a particular crystallite size window, , a size-dependent property variation was observed, which marks the domain of the nanoscience. , The length of ordered material (in the crystallinity) remained the distinguishing parameter between the three phases of solid, crystalline, , nanocrystalline, and amorphous, with crystalline material having the longest range of order of crystallinity, whereas amorphous material has the least. The distance up to which a (poly-)crystalline solid maintains the crystallinity defines the degree of order, which is quantified by the crystallite size. Though the crystallite size quantifies the degree of order in crystalline materials, ambiguity remains inherently, while quantifying the term in amorphous material as the range of the order is rather “short” and usually not defined even empirically.…”

mentioning

confidence: 99%

“…5,6 The length of ordered material 7 (in the crystallinity) remained the distinguishing parameter between the three phases of solid, 8 crystalline, 9,10 nanocrystalline, 11 and amorphous, 12 with crystalline material having the longest range of order of crystallinity, whereas amorphous material 13 has the least. The distance up to which a (poly-)crystalline solid maintains the crystallinity defines the degree of order, 14 which is quantified by the crystallite size. Though the crystallite size quantifies the degree of order in crystalline materials, ambiguity remains inherently, while quantifying the term in amorphous material as the range of the order is rather "short" and usually not defined even empirically.…”

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confidence: 99%

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Quantifying the Short-Range Order in Amorphous Silicon by Raman Scattering

et al. 2018

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Quantification of the short-range order in amorphous silicon has been formulized using Raman scattering by taking into account established frameworks for studying the spectral line-shape and size dependent Raman peak shift. A theoretical line-shape function has been proposed for representing the observed Raman scattering spectrum from amorphous-Si-based on modified phonon confinement model framework. While analyzing modified phonon confinement model, the term "confinement size" used in the context of nanocrystalline Si was found analogous to the short-range order distance in a-Si thus enabling one to quantify the same using Raman scattering. Additionally, an empirical formula has been proposed using bond polarizability model for estimating the short-range order making one capable to quantify the distance of short-range order by looking at the Raman peak position alone. Both the proposals have been validated using three different data sets reported by three different research groups from a-Si samples prepared by three different methods making the analysis universal.

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confidence: 99%

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confidence: 99%

Quantifying the Short-Range Order in Amorphous Silicon by Raman Scattering

et al. 2018

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“…Цей результат до певної міри перекликається зі спостереженням осöиляöійного характеру упорядкування при реа-кöійному утворенні ÎЦÊ-фази В 2 [23,24]. Частково осöиляöії шви-дкості упорядкування в нашому випадку можна пов'язати із перео-рієнтаöією доменів в проöесі взаємної дифузії.…”

Section: вплив третього компонентаunclassified

Influence of the Intermediate Nanointerlayer on a Kinetics of Phase Formation and Ordering in Thin Films—Mean-Field Kinetic Simulation

Bezpalchuk¹,

Rusenko²,

Гусак³

2017

Metallofiz. Noveishie Tekhnol.

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Розглядається спрощений середньопольовий кінетичний модель можли-вого впливу проміжного прошарку на швидкість перемішування та впо-рядкування у тонкоплівковій дифузійній парі типу Fe-Pt. Показано, що є широка область параметрів, за яких додавання проміжного прошарку пі-двищує ефективність перемішування та впорядкування.Ключові слова: наносистема, тонкі плівки FePt, дифузія, впорядкування, середньопольова метода, моделювання.Simplified mean-field kinetic model is applied to check the possible influence of the intermediate layer on the mixing and ordering rates in the Fe-Pt-type thin film system. This idea seems to work within the wide range of the parameters.

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“…Recently, we investigated the kinetics of ordering during interdiffusion and found the possibility of oscillatory ordering [62] (also see subsection 2.2). In that case, ordering was a second-order transition.…”

Section: Direct MC Simulation Of Reactive Diffusionmentioning

confidence: 99%

“…Results were a little bit unexpected (for details see [62]): 1. Formation of ordered domains in the couples with nonzero concentration steps clearly demonstrated nonmonotonic behaviourblinking.…”

Section: Direct MC Simulation Of Interdiffusion With Orderingmentioning

confidence: 99%