Output test compression for compound defect diagnosis

Tzeng, Chao-Wen; Huang, Shi-Yu

doi:10.1109/asicon.2009.5351349

2009 IEEE 8th International Conference on ASIC 2009

DOI: 10.1109/asicon.2009.5351349

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Output test compression for compound defect diagnosis

Chao-Wen Tzeng

Shi-Yu Huang

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Output test compression for compound defect diagnosis

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References 14 publications

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