Overall Input Efficiency and Total Equipment Efficiency

Sheu, D. Daniel

doi:10.1109/tsm.2006.884718

Cited by 22 publications

(13 citation statements)

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“…In the case of Desktops, the resource utilization practically do not vary on daily basis, and considering their business use -A day of intense use or the opposite, a day of very low use will have no relevance for large organizations -it seems rational to evaluate Desktops utilization on weekly basis. On the other hand, System Ps are more important in terms of business use, this is because of their technical purpose and cost associated with their ownership [6] [5] this means that these type of systems should be evaluated on daily basis.…”

Section: B Absolute Value Comparisonmentioning

confidence: 99%

“…[17], monitoring tools [12] [7], or business system management [19]. Let us start by the previous definitions of efficiency, some approaches have considered that efficiency is equal to time behavior plus resource utilization [5] [2]. There are other techniques like DEA (Data Envelopment Analysis) [3] that suggests comparing a system against the "best" system in order to get an efficient comparison.…”

Section: Implementation Statusmentioning

confidence: 99%

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Scoring System Utilization through Business Profiles

Iglesias

Thorburn

Parsons

et al. 2011

2011 IEEE Third International Conference on Cloud Computing Technology and Science

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Understanding system utilization is currently a difficult challenge for industry. Current monitoring tools tend to focus on monitoring critical servers and databases within a narrow technical context, and have not been designed to to manage extremely heterogeneous IT infrastructure such as desktops, laptops, and servers, where the number of devices can be in the order of tens of thousands. This is an issue for many different domains (organizations with large IT infrastructures, cloud computing providers, or software as a service providers) where an understanding of how computer hardware is being utilized is essential for understanding business cost, workload migrations and future investment requirements. Furthermore, organizations find it difficult to understand the raw metrics collected by current monitoring tools, in particular when trying to understand to what degree their systems are being utilized in the context of different business purposes. This paper presents different techniques for the extraction of meaningful resource utilization information from raw monitoring data, a utilization scoring algorithm, and then subsequently outlines a profile-based method for tracking the utilization of IT assets (systems) in large heterogeneous IT environments. We intend to determine how efficiently system resources are utilized considering their business use. We will provide to the end-user an assessment of the system utilization together with additional information to perform remedial action.

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Section: B Absolute Value Comparisonmentioning

confidence: 99%

Section: Implementation Statusmentioning

confidence: 99%

Scoring System Utilization through Business Profiles

Iglesias

Thorburn

Parsons

et al. 2011

2011 IEEE Third International Conference on Cloud Computing Technology and Science

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“…According to Chakravarthy et al (2007), Overall Equipment Efficiency (OEE) has been an established metric for measuring the manufacturing performance of tools mainly in semiconductor manufacturing operations. Sheu (2006) describes that OEE was originated from Japan in 1971. After that Nakajima introduces this index in US, it gained a lot of attention as the ultimate performance index, able to analyze equipments in the process (Pomorski, 1997) (Gaboury, 2001).…”

Section: Performance Indexesmentioning

confidence: 99%

Production Process Efficiency Analysis: an approach based on Colored Petri Nets

Bastos

Loures

Santos

et al. 2008

IFAC Proceedings Volumes

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“…Since OEE has been recognized as a standard efficiency index for measuring production equipment beginning in the late 1980s, many studies attempted to propose a better performance index to further represent the overall equipment efficiency or not just at the equipment level; for example, overall input equipment efficiency (OIE) for measuring the resource usage efficiency of a machine and total equipment efficiency (TEE) for measuring the usage efficiency of a machine [15], overall throughput effectiveness (OTE) for measuring factory-level performance [16], overall tool group efficiency (OGE) for measuring the equipment performance at the tool group level [17] and overall wafer effectiveness (OWE) for measuring wafer productivity [18]. In any case, ETH is not only a key input for OEE calculation, but also for the calculation of the others.…”

Section: Introductionmentioning

confidence: 99%

A Throughput Management System for Semiconductor Wafer Fabrication Facilities: Design, Systems and Implementation

Hsieh

Hsieh²

2018

Processes

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Equipment throughput is one of the most critical parameters for production planning and scheduling, which is often derived by optimization techniques to achieve business goals. However, in semiconductor manufacturing, up-to-date and reliable equipment throughput is not easy to estimate and maintain because of the high complexity and extreme amount of data in the production systems. This article concerns the development and implementation of a throughput management system tailored for a semiconductor wafer fabrication plant (Fab). A brief overview of the semiconductor manufacturing and an introduction of the case Fab are presented first. Then, we focus on the system architecture and some concepts of crucial modules. This study also describes the project timescales and difficulties and discusses both tangible and intangible benefits from this project.

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Overall Input Efficiency and Total Equipment Efficiency

Cited by 22 publications

References 0 publications

Scoring System Utilization through Business Profiles

Scoring System Utilization through Business Profiles

Production Process Efficiency Analysis: an approach based on Colored Petri Nets

A Throughput Management System for Semiconductor Wafer Fabrication Facilities: Design, Systems and Implementation

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