2015 IEEE Applied Power Electronics Conference and Exposition (APEC) 2015
DOI: 10.1109/apec.2015.7104691
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Overview of 1.2kV – 2.2kV SiC MOSFETs targeted for industrial power conversion applications

Abstract: This paper presents the latest 1.2kV-2.2kV SiC MOSFETs designed to maximize SiC device benefits for highpower, medium voltage power conversion applications. 1.2kV, 1.7kV and 2.2kV devices with die size of 4.5mm x 4.5mm were fabricated, exhibiting room temperature on-resistances of 34mOhm, 39mOhm and 41mOhm, respectively. The ability to safely withstand single-pulse avalanche energies of over 17J/cm 2 is demonstrated. Next, the 1.7kV SiC MOSFETs were used to fabricate half-bridge power modules. The module typic… Show more

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Cited by 86 publications
(45 citation statements)
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“…Although the claimed superior performance of SiC power devices over traditional Si devices has been the major driving force for most applications, the ability to withstand stressful and harsh conditions may alter the attitude of this conclusion. For instance, prior-art research on the Short Circuit (SC) capability of 1.2 kV SiC MOSFETs has indirectly proved so [3]- [10]. The static and dynamic performances of SiC MOSFETs have been compared to Si IGBTs in [7], [11] and to Si MOSFETs in [11], [12], where the advantages of WBG devices have been demonstrated (i.e., lower losses, higher operation temperature).…”
Section: Introductionmentioning
confidence: 99%
“…Although the claimed superior performance of SiC power devices over traditional Si devices has been the major driving force for most applications, the ability to withstand stressful and harsh conditions may alter the attitude of this conclusion. For instance, prior-art research on the Short Circuit (SC) capability of 1.2 kV SiC MOSFETs has indirectly proved so [3]- [10]. The static and dynamic performances of SiC MOSFETs have been compared to Si IGBTs in [7], [11] and to Si MOSFETs in [11], [12], where the advantages of WBG devices have been demonstrated (i.e., lower losses, higher operation temperature).…”
Section: Introductionmentioning
confidence: 99%
“…Figure 5 shows the FIT results at sea level versus the bias drain voltage (at V GS = 0 V) of SiC MOSFETs with their 95% confidence intervals. For comparison, in the same figure, the data of the commercial SiC MOSFETs C2M0080120D-rating 1200 V (Cree), SCT20N120-1200 V (STMicroelectronics), SCT2120AFC-650 V (ROHM) reported in [13], and GE-1200 V (GE) from [27] are shown. Data of the commercial SiC MOSFETs C2M0080120D, SCT20N120-1200 V, and SCT2120AFC-650 V from [13] and GE-1200 V from [27].…”
Section: Analysis Of Degradation Phenomenamentioning
confidence: 99%
“…In a cascaded cells system, the number of required cells follows from the peak phase voltage, , the semiconductor blocking voltage capability, V b,MV , and its utilization, u, as (1) With n cell = 5, the considered 1700 V SiC MOSFETs are utilized to about 65%, which is feasible regarding reliability [22]. 1) Transformer: Assuming unity power factor operation, the instantaneous power of the single-phase system at the SST's AC side is (2) Hence, the transformer RMS current of the IFE converter cell can be derived starting with the relation (3) where x denotes a local average value over half a switching cycle of the SRC.…”
Section: A Key Component Stressesmentioning
confidence: 99%