Overview of the irradiation-dependent behaviour of the negative dielectric properties of GaAs-based MIS devices

Evcin Baydilli, Esra; Kaymaz, Ahmet; Altındal, Şemsettin

doi:10.1016/j.radphyschem.2024.111877

Radiation Physics and Chemistry

2024

DOI: 10.1016/j.radphyschem.2024.111877

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Overview of the irradiation-dependent behaviour of the negative dielectric properties of GaAs-based MIS devices

Esra Evcin Baydilli,

Ahmet Kaymaz,

Şemsettin Altındal

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Cited by 2 publications

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The effect of Cu-doping to the DLC interlayer on the temperature dependent current-conduction mechanisms and barrier shape of the Schottky devices

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Overview of the irradiation-dependent behaviour of the negative dielectric properties of GaAs-based MIS devices

Cited by 2 publications

References 57 publications

The effect of Cu-doping to the DLC interlayer on the temperature dependent current-conduction mechanisms and barrier shape of the Schottky devices

The effect of Cu-doping to the DLC interlayer on the temperature dependent current-conduction mechanisms and barrier shape of the Schottky devices

The dielectric characteristics of spray deposited α-Si3N4:ZnO thin films: The nitride effect on frequency-dependent capacitance and conductance profiles

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