Carbon
deposition due to the inverse Boudouard reaction (2CO →
CO2 + C) has been studied on yttria-stabilized zirconia
(YSZ), Y2O3, and ZrO2 in comparison
to CH4 by a variety of different chemical, structural,
and spectroscopic characterization techniques, including electrochemical
impedance spectroscopy (EIS), Fourier-transform infrared (FT-IR) spectroscopy
and imaging, Raman spectroscopy, and electron microscopy. Consentaneously,
all experimental methods prove the formation of a more or less conducting
carbon layer (depending on the used oxide) of disordered nanocrystalline
graphite covering the individual grains of the respective pure oxides
after treatment in flowing CO at temperatures above ∼1023 K.
All measurements show that during carbon deposition, a more or less
substantial surface reduction of the oxides takes place. These results,
therefore, reveal that the studied pure oxides can act as efficient
nonmetallic substrates for CO-induced growth of highly distorted graphitic
carbon with possible important technological implications especially
with respect to treatment in pure CO or CO-rich syngas mixtures. Compared
to CH4, more carbon is generally deposited in CO under
otherwise similar experimental conditions. Although Raman and electron
microscopy measurements do not show substantial differences in the
structure of the deposited carbon layers, in particular, electrochemical
impedance measurements reveal major differences in the dynamic growth
process of the carbon layer, eventually leading to less percolated
islands and suppressed metallic conductivity in comparison to CH4-induced graphite.