2017
DOI: 10.1007/s10854-017-7243-5
|View full text |Cite
|
Sign up to set email alerts
|

Oxidation rates of aluminium nitride thin films: effect of composition of the atmosphere

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

1
11
0

Year Published

2019
2019
2022
2022

Publication Types

Select...
6

Relationship

0
6

Authors

Journals

citations
Cited by 10 publications
(12 citation statements)
references
References 19 publications
1
11
0
Order By: Relevance
“…In an oxidation diffusion-controlled regime, the oxidation process is controlled by the reagent transport through the growing gallium oxide layer. The oxidation kinetic can thus be described by a parabolic model [57]. Although this regime is note observed for oxidation at 900 • C (green curve), we can assume an under-linear thickening of the shell for higher oxidation times.…”
Section: Ga 2 O 3 -Shell Thickness Evolution and Formationmentioning
confidence: 90%
See 3 more Smart Citations
“…In an oxidation diffusion-controlled regime, the oxidation process is controlled by the reagent transport through the growing gallium oxide layer. The oxidation kinetic can thus be described by a parabolic model [57]. Although this regime is note observed for oxidation at 900 • C (green curve), we can assume an under-linear thickening of the shell for higher oxidation times.…”
Section: Ga 2 O 3 -Shell Thickness Evolution and Formationmentioning
confidence: 90%
“…Then, the oxidation process is characterized by two different regimes: The interfacial reaction-controlled and the oxidation diffusion-controlled regimes. In interfacial reaction-controlled regime, the GaN oxidation process is controlled by the surface reaction rate, leading to a linear oxidation [57]. As the oxidation duration is important, as the oxide thickness increases.…”
Section: Ga 2 O 3 -Shell Thickness Evolution and Formationmentioning
confidence: 99%
See 2 more Smart Citations
“…18 These results indicate that high TC alone is insufficient to improve heat sinking from 2D material devices, and that it could be important to modify the substrate surface to match the PDOS with the 2D material. For example, we note that among experiments, AlN tends to form a native oxide layer; 46 thus, the presence of heavier O atoms at the surface could increase the lowfrequency PDOS, leading to an experimentally measured TBC that is similar to that with SiO2. 8…”
Section: Tbc Dependence On Substratementioning
confidence: 94%