We report the outcome of atomic force microscopy local anodic oxidation experiments on 6H-SiC in air. Oxide thickness can be easily tuned by varying applied voltage and pulse duration. The height and the aspect ratio of single dots produced by single DC pulses are remarkably higher than what was reported previously, with self limiting heights exceeding 100 nm. We propose that the diminished density and the change in chemical composition of the oxide grown on SiC with respect to oxide grown under similar condition on Si cause a drop in the activation energy of oxanions diffusion within the newly formed oxide layer. V C 2013 AIP Publishing LLC.[http://dx.doi.org/10.1063/1.4825265] Silicon carbide is a wide gap semiconductor extensively employed in microelectronics industry. Due to its high thermal conductivity, high temperature operation, and chemical inertness, it is used as a valuable alternative to silicon for devices operating in hard conditions. Remarkably, SiC is the only semiconductor (except Si) whose native oxide is SiO 2 . However, SiC oxidation could result in mixed oxides products containing C inclusions. State-of-the-art technology in patterning semiconductor substrates mainly relies on mask-based techniques such as optical lithography or mask-less techniques like electron beam lithography, which are particularly suited for industrial applications such as large scale production in microelectronics and microfabrication, in general. Among all the alternatives, several promising scanning probe-related lithographies (SPLs) also emerged 1-4 as an affordable and very versatile nanofabrication technique. The advantages of using an atomic force microscope (AFM) reside in the in-line nanometric accuracy and in the possibility of directly applying multistep processes on pre-patterned substrates with no need for photoresist coatings and/or alignment tools. This makes SPL an ideal tool for flexible and fast prototyping of custom nanodevices. Few works have addressed the tip induced oxidation of SiC (Refs. 5-7) and none extensively explored the kinetics involved.In this work, we present the outcome of field induced oxidation (FIO) experiments in contact mode on 6H-SiC (0001) surface including: single pulse oxidation (pulse time ranging from 0.1 to 30 s), patterning examples (single lines and 3D patterns), and HF etch tests. The schematic of FIO is depicted in Fig. 1(a). By means of preliminary HF etching, we removed SiC native oxide layer to end up with an hydroxyl terminated surface. 8 On such surface, we were able to produce controlled single oxide dots for long oxidation times (>10 s), obtaining unexpected height and aspect ratio (height % 100 nm, full width at half maximum (FWHM) % 350 nm) in comparison with most FIO experiments (Figs. 1(b) and 1(c)). In order to have a quantitative explanation of the phenomenon, we compared the experimental data with available models dealing with Si probe oxidation in air. We estimated both oxide density and expansion rate by means of a wet etching test (dilute aqueous HF dis...